Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10180317 | Pattern-measuring device and computer program | Yasutaka Toyoda | 2019-01-15 |
| 9947088 | Evaluation condition setting method of semiconductor device, and evaluation condition setting apparatus | Kaoru FUKAYA | 2018-04-17 |