Issued Patents All Time
Showing 26–50 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9396620 | Money handling machine, money handling system, money handling method and valuable-medium handling machine | Atsushi Takayama, Keita Ito | 2016-07-19 |
| 9183622 | Image processing apparatus | Norio Hasegawa, Ryoichi Matsuoka, Atsuko Yamaguchi | 2015-11-10 |
| 9141879 | Pattern matching method, image processing device, and computer program | Hiroyuki Ushiba, Yuichi Abe, Mitsuji Ikeda | 2015-09-22 |
| 8977034 | Pattern shape evaluation method and pattern shape evaluation apparatus | Ryoichi Matsuoka | 2015-03-10 |
| 8867818 | Method of creating template for matching, as well as device for creating template | Ryoichi Matsuoka, Akiyuki Sugiyama | 2014-10-21 |
| 8705841 | Pattern inspection method, pattern inspection apparatus and pattern processing apparatus | Shinichi Shinoda, Ryoichi Matsuoka | 2014-04-22 |
| 8687921 | Image processing apparatus, image processing method, and image processing program | Shinichi Shinoda, Ryoichi Matsuoka | 2014-04-01 |
| 8653456 | Pattern inspection method, pattern inspection program, and electronic device inspection system | Tomohiro Funakoshi, Takehiro Hirai | 2014-02-18 |
| 8655050 | Pattern generating apparatus and pattern shape evaluating apparatus | Hideo Sakai, Ryoichi Matsuoka | 2014-02-18 |
| 8577124 | Method and apparatus of pattern inspection and semiconductor inspection system using the same | Akiyuki Sugiyama, Ryoichi Matsuoka, Takumichi Sutani, Hidemitsu Naya | 2013-11-05 |
| 8577125 | Method and apparatus for image generation | Shinichi Shinoda, Ryoichi Matsuoka | 2013-11-05 |
| 8515155 | Pattern generating apparatus and pattern shape evaluating apparatus | Hideo Sakai, Ryoichi Matsuoka | 2013-08-20 |
| 8498489 | Image inspection apparatus | Yuichi Abe, Mitsuji Ikeda, Yoshimichi Sato | 2013-07-30 |
| 8445871 | Pattern measurement apparatus | Ryoichi Matsuoka, Akihiro Onizawa, Akiyuki Sugiyama, Hidetoshi Morokuma | 2013-05-21 |
| 8363923 | Pattern generating apparatus and pattern shape evaluating apparatus | Hideo Sakai, Ryoichi Matsuoka | 2013-01-29 |
| 8355562 | Pattern shape evaluation method | Ryoichi Matsuoka, Akiyuki Sugiyama | 2013-01-15 |
| 8338804 | Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus | Hidetoshi Morokuma, Akiyuki Sugiyama, Ryoichi Matsuoka, Takumichi Sutani | 2012-12-25 |
| 8217351 | Pattern inspection method and pattern inspection system | Yasunari Souda, Yuji Takagi, Koji Arai | 2012-07-10 |
| 8139868 | Image processing method for determining matching position between template and search image | Yuichi Abe, Mitsuji Ikeda, Yoshimichi Sato | 2012-03-20 |
| 8115169 | Method and apparatus of pattern inspection and semiconductor inspection system using the same | Akiyuki Sugiyama, Ryoichi Matsuoka, Takumichi Sutani, Hidemitsu Naya | 2012-02-14 |
| 8100245 | Bill recognizing and counting apparatus | Toshio Numata, Shinji Matsuura, Teruo Sudo, Tomoyasu Sato | 2012-01-24 |
| 8077962 | Pattern generating apparatus and pattern shape evaluating apparatus | Hideo Sakai, Ryoichi Matsuoka | 2011-12-13 |
| 8041104 | Pattern matching apparatus and scanning electron microscope using the same | Mitsuji Ikeda, Atsushi Takane | 2011-10-18 |
| 7991218 | Pattern matching apparatus and semiconductor inspection system using the same | Takumichi Sutani, Ryoichi Matsuoka | 2011-08-02 |
| 7978904 | Pattern inspection apparatus and semiconductor inspection system | Takumichi Sutani, Ryoichi Matsuoka, Hidemitsu Naya | 2011-07-12 |