Issued Patents All Time
Showing 51–62 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7923703 | Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus | Hidetoshi Morokuma, Akiyuki Sugiyama, Ryoichi Matsuoka, Takumichi Sutani | 2011-04-12 |
| 7925076 | Inspection apparatus using template matching method using similarity distribution | Yuichi Abe, Mitsuji Ikeda, Yoshimichi Satou | 2011-04-12 |
| 7786437 | Pattern inspection method and pattern inspection system | Yasunari Souda, Yuji Takagi, Koji Arai | 2010-08-31 |
| 7732792 | Pattern measurement apparatus | Ryoichi Matsuoka, Akihiro Onizawa, Akiyuki Sugiyama, Hidetoshi Morokuma | 2010-06-08 |
| 7507961 | Method and apparatus of pattern inspection and semiconductor inspection system using the same | Akiyuki Sugiyama, Ryoichi Matsuoka, Takumichi Sutani, Hidemitsu Naya | 2009-03-24 |
| 7369284 | Image signal processing method, image signal processing device, and image signal processing system | Tatsuki Inuzuka | 2008-05-06 |
| 7230243 | Method and apparatus for measuring three-dimensional shape of specimen by using SEM | Maki Tanaka, Atsushi Miyamoto, Hidetoshi Morokuma, Chie Shishido, Mitsuji Ikeda | 2007-06-12 |
| 7151619 | Image formation apparatus | Tatsuki Inuduka | 2006-12-19 |
| 7084850 | Image display system and image information transmission method | Ikuo Hiyama, Tsunenori Yamamoto, Akitoyo Konno, Makoto Tsumura, Yoshiyuki Kaneko +2 more | 2006-08-01 |
| 6992676 | Image display system | Tatsuki Inuzuka, Tsunenori Yamamoto, Ikuo Hiyama, Makoto Tsumura | 2006-01-31 |
| 6784891 | Image display system | Tatsuki Inuzuka, Tsunenori Yamamoto, Ikuo Hiyama, Makoto Tsumura | 2004-08-31 |
| 6700680 | Image formation apparatus | Tatsuki Inuduka | 2004-03-02 |