Issued Patents All Time
Showing 26–50 of 196 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10229812 | Sample observation method and sample observation device | Minoru Harada, Takehiro Hirai | 2019-03-12 |
| 10223202 | Optical disc apparatus for recording and reproducing data onto and from an optical disc based on an evaluation value | Kohei Nakata | 2019-03-05 |
| 10203851 | Defect classification apparatus and defect classification method | Yohei Minekawa, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2019-02-12 |
| 10094658 | Overlay measurement method, device, and display device | Fumihiko Fukunaga, Yasunori Goto | 2018-10-09 |
| 10054153 | Manufacturing method for sliding bearing, and sliding bearing | Daisuke Seki | 2018-08-21 |
| 10054162 | Sliding bearing | Daisuke Seki | 2018-08-21 |
| 9922414 | Defect inspection method and defect inspection device | Minoru Harada, Masashi Sakamoto, Takehiro Hirai | 2018-03-20 |
| 9811897 | Defect observation method and defect observation device | Minoru Harada, Ryo Nakagaki, Takehiro Hirai, Hirohiko Kitsuki | 2017-11-07 |
| 9799112 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Ryo Nakagaki, Fumihiko Fukunaga | 2017-10-24 |
| 9649701 | Cutting insert and indexable insert-type cutting tool | Nobukazu Horiike | 2017-05-16 |
| 9521372 | Pattern measuring apparatus, pattern measuring method, and computer-readable recording medium on which a pattern measuring program is recorded | Yoshinori Momonoi, Koichi Hamada, Michio Hatano, Hideyuki Kazumi | 2016-12-13 |
| 9511427 | Cutting insert and indexable insert-type cutting tool | Nobukazu Horiike | 2016-12-06 |
| 9496985 | Decoding system and decoding method | Tsuyoshi Nakasendo, Yasumori Hino, Kohei Nakata | 2016-11-15 |
| 9401015 | Defect classification method, and defect classification system | Yohei Minekawa, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-07-26 |
| 9390490 | Method and device for testing defect using SEM | Minoru Harada, Ryo Nakagaki, Naoki Hosoya, Toshifumi Honda, Takehiro Hirai | 2016-07-12 |
| 9191628 | Pattern dimension measurement method, pattern dimension measurement device, program for causing computer to execute pattern dimension measurement method, and recording medium having same recorded thereon | Shinya Yamada | 2015-11-17 |
| 9177596 | Decoding device and decoding method | Kohei Nakata, Yasumori Hino, Tsuyoshi Nakasendo | 2015-11-03 |
| 9153020 | Semiconductor device defect inspection method and system thereof | — | 2015-10-06 |
| 9063871 | Decoding device and decoding method | Tsuyoshi Nakasendo, Yasumori Hino, Kohei Nakata | 2015-06-23 |
| 8919173 | Composite hose with a corrugated metal tube and method for making the same | Motoshige Hibino, Minoru Hiramatsu, Koji Uchino | 2014-12-30 |
| 8690493 | End mill | Takashi Miki | 2014-04-08 |
| 8675949 | Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review tool | Minoru Harada, Yuichi Hamamura | 2014-03-18 |
| 8621400 | Method of evaluating systematic defect, and apparatus therefor | Yuichi Hamamura | 2013-12-31 |
| 8595666 | Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program | Koichi Hayakawa, Takehiro Hirai, Yutaka Tandai, Tamao Ishikawa, Tsunehiro Sakai +3 more | 2013-11-26 |
| 8556547 | Radius end mill | Seiichiro Kitaura | 2013-10-15 |