Issued Patents All Time
Showing 76–100 of 196 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7512259 | Defect inspection method and apparatus | Shunji Maeda, Kenji Oka, Yukihiro Shibata, Minoru Yoshida, Chie Shishido +2 more | 2009-03-31 |
| 7493546 | Data recording method, recording medium and reproduction apparatus | Makoto Usui, Hiroyuki Yabuno | 2009-02-17 |
| 7459712 | Method and apparatus of measuring pattern dimension and controlling semiconductor device process having an error revising unit | Maki Tanaka, Hidetoshi Morokuma, Chie Shishido | 2008-12-02 |
| 7356177 | Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus | Kenji Obara, Ryo Nakagaki, Yasuhiko Ozawa, Toshiei Kurosaki, Seiji Isogai | 2008-04-08 |
| 7352890 | Method for analyzing circuit pattern defects and a system thereof | Atsushi Shimoda, Ichirou Ishimaru, Takuo Tamura, Yuichi Hamamura, Kenji Watanabe +2 more | 2008-04-01 |
| 7335881 | Method of measuring dimensions of pattern | Maki Tanaka, Chie Shishido | 2008-02-26 |
| 7284180 | Data recording method, recording medium and reproduction apparatus | Makoto Usui, Hiroyuki Yabuno | 2007-10-16 |
| 7281191 | Data recording method, recording medium and reproduction apparatus | Makoto Usui, Hiroyuki Yabuno | 2007-10-09 |
| 7277368 | Playback method, playback control circuit and playback apparatus for a recording medium | Toyoji Gushima, Makoto Usui, Yuichi Hashimoto | 2007-10-02 |
| 7274813 | Defect inspection method and apparatus | Shunji Maeda, Kenji Oka, Yukihiro Shibata, Minoru Yoshida, Chie Shishido +2 more | 2007-09-25 |
| 7272772 | Data recording method, recording medium and reproduction apparatus | Makoto Usui, Hiroyuki Yabuno | 2007-09-18 |
| 7263216 | Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof | Chie Shishido, Shuji Maeda, Takanori Ninomiya, Takashi Hiroi, Masahiro Watanabe +1 more | 2007-08-28 |
| 7231079 | Method and system for inspecting electronic circuit pattern | Hirohito Okuda, Masahiro Watanabe, Shunji Maeda, Minori Noguchi, Yoshimasa Ooshima +1 more | 2007-06-12 |
| 7230239 | Apparatus for inspecting three dimensional shape of a specimen and method of watching an etching process using the same | Maki Tanaka, Hidetoshi Morokuma, Chie Shishido | 2007-06-12 |
| 7216311 | System and method for evaluating a semiconductor device pattern, method for controlling process of forming a semiconductor device pattern and method for monitoring a semiconductor device manufacturing process | Maki Tanaka, Chie Shishido, Ryo Nakagaki | 2007-05-08 |
| 7205555 | Defect inspection apparatus and defect inspection method | Hirohito Okuda, Toshifumi Honda | 2007-04-17 |
| 7192063 | Metallic tubular hose having a rubber or resin hard material layer | Minoru Hiramatsu | 2007-03-20 |
| 7178088 | Method and circuit for error correction, error correction encoding, data reproduction, or data recording | Yuichi Hashimoto, Makoto Usui, Naohiro Kimura, Yoshikazu Yamamoto | 2007-02-13 |
| 7173268 | Method of measuring pattern dimension and method of controlling semiconductor device process | Maki Tanaka, Hidetoshi Morokuma, Chie Shishido | 2007-02-06 |
| 7170593 | Method of reviewing detected defects | Toshifumi Honda, Hirohito Okuda | 2007-01-30 |
| 7166839 | Apparatus for measuring a three-dimensional shape | Maki Tanaka, Chie Shishido | 2007-01-23 |
| 7122796 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2006-10-17 |
| 7114526 | Composite hose with a corrugated metal tube | Minoru Hiramatsu | 2006-10-03 |
| 7113628 | Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus | Kenji Obara, Ryo Nakagaki, Yasuhiro Ozawa, Toshiei Kurosaki, Seiji Isogai | 2006-09-26 |
| 7111222 | Data recording method, recording medium and reproduction apparatus | Makoto Usui, Hiroyuki Yabuno | 2006-09-19 |