YT

Yuji Takagi

Sumitomo Electric Industries: 60 patents #113 of 21,551Top 1%
HH Hitachi High-Technologies: 52 patents #24 of 1,917Top 2%
HI Hitachi: 49 patents #305 of 28,497Top 2%
PA Panasonic: 12 patents #2,079 of 21,108Top 10%
TI Tokai Rubber Industries: 9 patents #45 of 557Top 9%
Honda Motor Co.: 7 patents #3,151 of 21,052Top 15%
MM Mitsubishi Materials: 5 patents #205 of 1,543Top 15%
TC Taiho Kogyo Co.: 2 patents #102 of 332Top 35%
Philips: 1 patents #3,761 of 7,731Top 50%
SO Sony: 1 patents #17,262 of 25,231Top 70%
SL Sumitomo Riko Company Limited: 1 patents #206 of 446Top 50%
MC Mastsushita Electric Industrial Co.: 1 patents #1 of 26Top 4%
NE Nec: 1 patents #7,889 of 14,502Top 55%
NO Noritz: 1 patents #135 of 228Top 60%
HG Honda Research Institute Europe Gmbh: 1 patents #54 of 117Top 50%
Overall (All Time): #3,513 of 4,157,543Top 1%
196
Patents All Time

Issued Patents All Time

Showing 126–150 of 196 patents

Patent #TitleCo-InventorsDate
RE38611 Method for substituting defective recording of discoid recording medium and discoid recording medium recording and reproducing device Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh 2004-10-05
6797526 Method for manufacturing semiconductor devices and method and its apparatus for processing detected defect data Maki Tanaka, Shunji Maeda, Minori Noguchi, Takafumi Okabe, Chie Shishido 2004-09-28
6756589 Method for observing specimen and device therefor Kenji Obara, Atsushi Shimoda, Ryou Nakagaki, Seiji Isogai, Yasuhiko Ozawa +3 more 2004-06-29
6741941 Method and apparatus for analyzing defect information Kenji Obara, Hisae Shibuya 2004-05-25
6728195 Multi-layered optical disk with shifted track and layer identification and method of detecting a track Isao Satoh, Yoshihisa Fukushima, Yasushi Azumatani, Hiroshi Hamasaka 2004-04-27
6717142 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more 2004-04-06
6678227 Simultaneous recording and reproduction apparatus and simultaneous multi-channel reproduction apparatus Satoshi Kondo, Hideki Fukuda, Yoshinari Takemura, Masaaki Kondo, Keiichi Kawashima 2004-01-13
6657221 Image classification method, observation method, and apparatus thereof with different stage moving velocities Ryo Nakagaki, Takashi Hiroi, Masahiro Watanabe, Minori Noguchi, Kazuo Aoki 2003-12-02
6622054 Method monitoring a quality of electronic circuits and its manufacturing condition and system for it Hirohito Okuda, Toshifumi Honda, Hisae Yamamura, Hideaki Doi, Shigeshi Yoshinaga 2003-09-16
6614923 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof Chie Shishido, Shuji Maeda, Takanori Ninomiya, Takashi Hiroi, Masahiro Watanabe +1 more 2003-09-02
6587581 Visual inspection method and apparatus therefor Yukio Matsuyama, Takashi Hiroi, Maki Tanaka, Asahiro Kuni, Junzou Azuma +2 more 2003-07-01
6567350 Method for adjusting control operation in an optical disc recording device Keiichi Kawashima, Hiroshi Sugimoto, Hirofumi Ide, Kenzo Ishibashi 2003-05-20
6553323 Method and its apparatus for inspecting a specimen Kenji Obara, Toshifumi Honda, Ryo Nakagaki, Toshiei Kurosaki, Yasuhiko Ozawa 2003-04-22
6549499 Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh 2003-04-15
6546308 Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices Hideaki Doi, Makoto Ono 2003-04-08
6496455 Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh 2002-12-17
6476388 Scanning electron microscope having magnification switching control Ryo Nakagaki, Atsushi Shimoda, Kenji Obara, Yasuhiko Ozawa, Hideka Bamba +4 more 2002-11-05
6438438 Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices Hideaki Doi, Makoto Ono 2002-08-20
6421315 Multi-layered optical disk with shifted track and layer identification and method of detecting a track Isao Satoh, Yoshihisa Fukushima, Yasushi Azumatani, Hiroshi Hamasaka 2002-07-16
6390140 Fluid-impermeable composite hose Nobuaki Niki, Kunihiro Noba 2002-05-21
6373054 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more 2002-04-16
6351447 Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara 2002-02-26
6314078 Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh 2001-11-06
6301220 Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh 2001-10-09
6175549 Recording defect substitution method of a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh 2001-01-16