Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8072597 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Akira Hamamatsu, Kenji Watanabe, Tetsuya Watanabe +1 more | 2011-12-06 |
| 7511806 | Apparatus and method for inspecting defects | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Tetsuya Watanabe | 2009-03-31 |
| 7315366 | Apparatus and method for inspecting defects | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Tetsuya Watanabe | 2008-01-01 |
| 7256412 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Akira Hamamatsu, Kenji Watanabe, Tetsuya Watanabe +1 more | 2007-08-14 |
| 7231079 | Method and system for inspecting electronic circuit pattern | Hirohito Okuda, Yuji Takagi, Masahiro Watanabe, Shunji Maeda, Minori Noguchi +1 more | 2007-06-12 |
| 7187438 | Apparatus and method for inspecting defects | Akira Hamamatsu, Minori Noguchi, Hidetoshi Nishiyama, Tetsuya Watanabe | 2007-03-06 |
| 7115892 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Akira Hamamatsu, Kenji Watanabe, Tetsuya Watanabe +1 more | 2006-10-03 |
| 6998630 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Akira Hamamatsu, Kenji Watanabe, Tetsuya Watanabe +1 more | 2006-02-14 |
| 6797975 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Akira Hamamatsu, Kenji Watanabe, Tetsuya Watanabe +1 more | 2004-09-28 |
| 5321354 | Method for inspecting semiconductor devices | Toshio Shimizu, Katsuya Iida, Fumiaki Kumazawa | 1994-06-14 |