Issued Patents All Time
Showing 25 most recent of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507229 | Molded body for electronic function, method for manufacturing the same, and operation device using molded body for electronic function | Takashi Morimoto, Hideaki Eto, Tomoya Moriura, Wahei Agemizu | 2022-11-22 |
| 10962702 | Input device | Shigeru Yamane, Hideaki Eto, Wahei Agemizu, Masahiro Kasano, Go Nakatani | 2021-03-30 |
| 9287168 | Semiconductor device and process for producing the same | Jusuke Ogura, Sergey Pidin | 2016-03-15 |
| 9224043 | Map generation apparatus, map generation method, moving method for moving body, and robot apparatus | Osamu Hasegawa, Noppharit Tongprasit, Sangkyu Yi | 2015-12-29 |
| 8749062 | Semiconductor device and process for producing the same | Jusuke Ogura, Sergey Pidin | 2014-06-10 |
| 8247290 | Semiconductor device and method of manufacturing thereof | Junichi Ariyoshi, Toru Anezaki | 2012-08-21 |
| 7803518 | Method for manufacturing micro structure | — | 2010-09-28 |
| 7670759 | Micro pattern forming method and semiconductor device manufacturing method | — | 2010-03-02 |
| 7601576 | Method for fabricating semiconductor device | Rintaro Suzuki, Masanori Terahara | 2009-10-13 |
| 7550394 | Semiconductor device and fabrication process thereof | — | 2009-06-23 |
| 7501686 | Semiconductor device and method for manufacturing the same | Masaki Okuno, Sadahiro Kishii, Masanori Terahara, Shigeo Satoh, Kaina Suzuki | 2009-03-10 |
| 7455618 | Fluid level regulating method and fluid temperature regulator for automatic transmission | Ryuji Chida | 2008-11-25 |
| 7177020 | Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process | Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Hidetoshi Nishiyama, Kazuhiko Matsuoka +1 more | 2007-02-13 |
| 7116816 | Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen | Maki Tanaka, Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Kenji Watanabe +2 more | 2006-10-03 |
| 6979610 | Semiconductor device fabrication method | Masanori Terahara | 2005-12-27 |
| 6919564 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi +2 more | 2005-07-19 |
| 6903821 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi +2 more | 2005-06-07 |
| 6894773 | Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process | Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Hidetoshi Nishiyama, Kazuhiko Matsuoka +1 more | 2005-05-17 |
| 6881653 | Method of manufacturing CMOS semiconductor device | Manabu Kojima, Kenichi Goto, Kenichi Okabe | 2005-04-19 |
| 6759655 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi +1 more | 2004-07-06 |
| 6703850 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto +2 more | 2004-03-09 |
| 6650409 | Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system | Minori Noguchi, Yukio Kembo, Hidetoshi Nishiyama, Hideaki Doi, Masataka Shiba +6 more | 2003-11-18 |
| 6583634 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto +2 more | 2003-06-24 |
| 6565465 | Continuously variable belt transmission | Masabumi Nishigaya, Shinya Kuwabara, Masami Sugaya, Shinji Kasuga, Shoichi Sayo | 2003-05-20 |
| 6558463 | Solution and method for forming a ferroelectric film | Takashi Hase, Yoichi Miyasaka, Toshinobu Shinnai, Taku Yamate, Hayato Katsuragi +1 more | 2003-05-06 |