Issued Patents All Time
Showing 1–25 of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933796 | Quality control method, quality control system, management apparatus, analyzer, and quality control abnormality determination method | Keiji Fujimoto, Yasushi Hasui | 2024-03-19 |
| 11340242 | Quality control method, quality control system, management apparatus, analyzer, and quality control abnormality determination method | Keiji Fujimoto, Yasushi Hasui | 2022-05-24 |
| 7963792 | Plug detachment prevention structure | Shigeru Sawada | 2011-06-21 |
| 7375275 | Electronic instrument and reproduction system | Kazuo Kurahashi | 2008-05-20 |
| 7177020 | Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process | Hiroshi Morioka, Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Hidetoshi Nishiyama +1 more | 2007-02-13 |
| 6894773 | Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process | Hiroshi Morioka, Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Hidetoshi Nishiyama +1 more | 2005-05-17 |
| 6650409 | Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system | Minori Noguchi, Yukio Kembo, Hiroshi Morioka, Hidetoshi Nishiyama, Hideaki Doi +6 more | 2003-11-18 |
| 6628817 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 2003-09-30 |
| 6529619 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 2003-03-04 |
| 6525764 | Image read method for performing image signal processes complying with the color of a reference portion of a recording medium, and image read apparatus adopting the method | Kazuyuki Kondo | 2003-02-25 |
| 6462866 | Imaging optical system and original reading apparatus | Miho Sugiyama, Kazuyuki Kondo, Tadao Hayashide | 2002-10-08 |
| 6376758 | Electronic score tracking musical instrument | Nobuhiro Yamada | 2002-04-23 |
| 6339653 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 2002-01-15 |
| 6333455 | Electronic score tracking musical instrument | Kazuya Yanase, Nobuhiro Yamada | 2001-12-25 |
| 6330352 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 2001-12-11 |
| 6288734 | Scanning optical device and image forming apparatus using the same | — | 2001-09-11 |
| 6289134 | Image read method and apparatus for optimizing shading conditions | Kazuyuki Kondo | 2001-09-11 |
| 6185322 | Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 2001-02-06 |
| 6118555 | Image reading apparatus having a light source including a fluorescent lamp | Kenichi Sasaki, Miho Sugiyama | 2000-09-12 |
| 5841893 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 1998-11-24 |
| 5517480 | Magneto-optical information reproducing apparatus that splits a light beam into at least three light beams advancing in the same direction | Osamu Koyama | 1996-05-14 |
| 5490129 | Optical head and optical information reading apparatus | Seiichiro Satomura, Katuya Yamazaki, Takeshi Yamawaki | 1996-02-06 |
| 5463459 | Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process | Hiroshi Morioka, Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Hidetoshi Nishiyama +1 more | 1995-10-31 |
| 5420848 | Optical system for optical information recording/reproducing apparatus having a galvano mirror | Nobuaki Date, Kenichi Sasaki | 1995-05-30 |
| 5289313 | Optical head using semiconductor laser array as light source | — | 1994-02-22 |