Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6628817 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Yuzo Taniguchi +10 more | 2003-09-30 |
| 6529619 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Yuzo Taniguchi +10 more | 2003-03-04 |
| 6339653 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Yuzo Taniguchi +10 more | 2002-01-15 |
| 6330352 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Yuzo Taniguchi +10 more | 2001-12-11 |
| 6185322 | Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Yuzo Taniguchi +10 more | 2001-02-06 |
| 5841893 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Yuzo Taniguchi +10 more | 1998-11-24 |
| 5536128 | Method and apparatus for carrying a variety of products | Sadao Shimoyashiro, Takemasa Iwasaki, Hiroyuki Kawaji, Toyohide Hamada, Minoru Ikeda +1 more | 1996-07-16 |
| 4731855 | Pattern defect inspection apparatus | Kyo Suda, Shigeharu Kimura, Shinobu Hase, Chusuke Munakata, Kanji Kinameri +3 more | 1988-03-15 |
| 4544318 | Manufacturing system | Hisashi Maejima, Jun Suzuki, Keishin Fujikawa | 1985-10-01 |
| 4342515 | Method of inspecting the surface of an object and apparatus therefor | Masakuni Akiba, Jun Suzuki | 1982-08-03 |
| 4282825 | Surface treatment device | Tetsuya Takagaki, Hisao Seki, Shirou Terasaki, Hitoshi Horimuki | 1981-08-11 |