Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12146846 | Cell analysis apparatus and cell analysis method | Akiko Hisada, Yuji Matsumoto, Takaaki Tsuchida, Noriko MOTOI, Mizuho Fujima | 2024-11-19 |
| 11561184 | Support system for specified inspection, support method for specified inspection, and non-transitory computer readable medium | Nobuyoshi TADA, Shigeya Tanaka, Minori Noguchi, Maya Goto | 2023-01-24 |
| 11239051 | Charged particle beam device | Mai YOSHIHARA | 2022-02-01 |
| 10141157 | Method for adjusting height of sample and observation system | Makoto Nakabayashi, Shinsuke Kawanishi | 2018-11-27 |
| 10134564 | Charged particle beam device | Taiga Okumura, Takashi Ohshima, Minami Shouji, Akiko Hisada, Akio Yoneyama | 2018-11-20 |
| 9875877 | Electron scanning microscope and image generation method | Shinsuke Kawanishi | 2018-01-23 |
| 9812288 | Sample holder with light emitting and transferring elements for a charged particle beam apparatus | Minami Shouji, Takashi Ohshima, Hideo Morishita, Kunio Harada | 2017-11-07 |