Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12424406 | Charged particle beam device, and method for adjusting image capturing conditions in said charged particle beam device | Tomohito Nakano, Makoto Suzuki, Ryota Watanabe | 2025-09-23 |
| 11810752 | Charged particle beam device and power supply device | Wen Li, Hiroyuki Takahashi, Makoto Suzuki | 2023-11-07 |
| 11610756 | Charged particle beam apparatus and control method | Kaori Bizen, Ryota Watanabe, Daisuke Bizen | 2023-03-21 |
| 11456150 | Charged particle beam device | Kaori Bizen, Minoru Yamazaki, Daisuke Bizen, Noritsugu Takahashi | 2022-09-27 |
| 10964508 | Charged-particle beam device | Kouichi Kurosawa | 2021-03-30 |
| 10541103 | Charged particle beam device | Toshiyuki Yokosuka, Hideyuki Kazumi, Kouichi Kurosawa, Kenichi Myochin | 2020-01-21 |
| 10446359 | Charged particle beam device | Toshiyuki Yokosuka, Hideyuki Kazumi, Hajime Kawano | 2019-10-15 |
| 10229811 | Charged particle beam inclination correction method and charged particle beam device | Hideyuki Kazumi | 2019-03-12 |
| 10020160 | Charged particle beam device | Koichi Kuroda, Hajime Kawano, Makoto Suzuki | 2018-07-10 |
| 9627171 | Charged particle beam device | Hiroshi Makino, Hideyuki Kazumi, Minoru Yamazaki, Miki Isawa | 2017-04-18 |
| 9502212 | Charged particle beam apparatus | Miki Isawa, Minoru Yamazaki, Hitoshi Tamura, Hideyuki Kazumi | 2016-11-22 |
| 9472376 | Scanning electron microscope | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Hiroshi Makino, Miki Isawa +2 more | 2016-10-18 |
| 8648300 | Charged particle beam apparatus | Miki Isawa, Minoru Yamazaki, Hiroshi Makino, Hideyuki Kazumi | 2014-02-11 |