MS

Masakazu Sugaya

HI Hitachi: 18 patents #2,067 of 28,497Top 8%
HH Hitachi High-Technologies: 3 patents #776 of 1,917Top 45%
HS Hirotsu Bio Science: 2 patents #2 of 13Top 20%
Canon: 2 patents #12,681 of 19,416Top 70%
Overall (All Time): #182,372 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
11443851 Cancer test system and method for assessing cancer test Minoru Sakairi, Koichi Terada, Taku Nakamura, Norihito Kuno 2022-09-13
11249069 Cancer analysis system and cancer analysis method Minoru Sakairi, Koichi Terada, Taku Nakamura, Norihito Kuno 2022-02-15
10945684 Ultrasonic CT device Yushi Tsubota, Hideo Kashima, Takahide Terada, Kenichi Kawabata, Wenjing WU +2 more 2021-03-16
10329525 Liquid feeding device and cell culture device Masaharu Kiyama, Guangbin Zhou, Takayuki Nozaki, Ryota Nakajima, Daisuke Suzuki +4 more 2019-06-25
10184100 Liquid delivery device and cell culture device using same Masaharu Kiyama, Guangbin Zhou, Takayuki Nozaki, Shizu Matsuoka, Taku Nakamura +1 more 2019-01-22
10153128 Charged particle beam apparatus and sample elevating apparatus Yusuke Moriwaki, Koichi Terada, Nobuo Shibata, Hironori Ogawa, Hiroyuki Kitsunai +2 more 2018-12-11
10138450 Cell culture device Takayuki Nozaki, Guangbin Zhou, Masaharu Kiyama, Ryota Nakajima, Shizu Matsuoka +2 more 2018-11-27
10087410 Cell culturing device, culturing vessel, and holding vessel Takayuki Nozaki, Guangbin Zhou, Masaharu Kiyama, Taku Nakamura, Shizu TAKEDA +2 more 2018-10-02
10048172 Substance-testing apparatus, substance-testing system, and substance-testing method Hideo Kashima, Koichi Terada, Yasuaki Takada, Hisashi Nagano 2018-08-14
9850696 Microparticle detection device and security gate Koichi Terada, Hideo Kashima, Yasuaki Takada, Hisashi Nagano 2017-12-26
9696288 Attached matter testing device and testing method Hideo Kashima, Koichi Terada, Yasunori Doi, Yasutaka Suzuki, Hisashi Nagano +2 more 2017-07-04
9423388 Particle analyzing device Koichi Terada, Hideo Kashima, Hisashi Nagano, Yasuaki Takada, Hiromi Satou 2016-08-23
9417163 Analyzer for substance Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto, Hideo Kashima, Koichi Terada +1 more 2016-08-16
9261437 Attached matter inspection device Hideo Kashima, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada +1 more 2016-02-16
9214324 Analysis device and analysis method Hisashi Nagano, Yasutaka Iida, Hideo Kashima, Yuichiro Hashimoto, Masuyuki Sugiyama +2 more 2015-12-15
9040905 Analysis device and analysis method Hisashi Nagano, Yasutaka Suzuki, Hideo Kashima, Yuichiro Hashimoto, Masuyuki Sugiyama +2 more 2015-05-26
7408760 Charged particle beam application system Sayaka Tanimoto, Yasunari Soda, Hiroshi Tooyama, Takeshi Tsutsumi, Yasuhiro Someda 2008-08-05
7341393 Mechanism for sealing Masaki Hosoda, Masato Muraki, Yasuhiro Someda, Mahito Negishi, Koichi Wakizaka 2008-03-11
6839142 Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatus Fumio Isshiki, Tatsundo Suzuki, Masahiro Yamaoka, Sumio Hosaka 2005-01-04
6717156 Beam as well as method and equipment for specimen fabrication Hiroyasu Shichi, Muneyuki Fukuda, Kaoru Umemura, Hidemi Koike 2004-04-06
6687013 Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatus Fumio Isshiki, Tatsundo Suzuki, Masahiro Yamaoka, Sumio Hosaka 2004-02-03
6518548 Substrate temperature control system and method for controlling temperature of substrate Fumio Murai, Yutaka Kaneko, Masafumi Kanetomo, Shigeki Hirasawa, Tomoji Watanabe +2 more 2003-02-11
6394797 Substrate temperature control system and method for controlling temperature of substrate Fumio Murai, Yutaka Kaneko, Masafumi Kanetomo, Shigeki Hirasawa, Tomoji Watanabe +2 more 2002-05-28