Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2011-05-31 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2008-08-26 |
| 7408760 | Charged particle beam application system | Sayaka Tanimoto, Yasunari Soda, Masakazu Sugaya, Takeshi Tsutsumi, Yasuhiro Someda | 2008-08-05 |
| 7026830 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2006-04-11 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2003-05-06 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-12-11 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-01-09 |
| 5369396 | Apparatus for detecting a level of liquid | Nobuo Kurata | 1994-11-29 |
| 5001409 | Surface metrological apparatus | Sumio Hosaka, Shigeyuki Hosoki, Keiji Takata, Masatoshi Ohtake, Hitoshi Kondou | 1991-03-19 |
| 4541082 | Device for optically tracking information | Tatsuo Horikoshi, Seiji Yonezawa, Toshiaki Tsuyoshi, Masatoshi Otake | 1985-09-10 |