YS

Yasuhiro Someda

Canon: 18 patents #3,676 of 19,416Top 20%
HI Hitachi: 13 patents #3,142 of 28,497Top 15%
HH Hitachi High-Technologies: 4 patents #621 of 1,917Top 35%
Overall (All Time): #118,099 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 25 most recent of 31 patents

Patent #TitleCo-InventorsDate
11357407 Photoacoustic apparatus 2022-06-14
10561396 Ultrasonic probe, and photoacoustic-ultrasonic system and inspection object imaging apparatus including the ultrasonic probe Keishi Saito, Yasufumi Asao, Katsumi Nakagawa, Shigeru Ichihara 2020-02-18
10455664 Analyte-information acquisition apparatus Toshinobu Tokita 2019-10-22
10413193 Photoacoustic apparatus 2019-09-17
9693753 Ultrasonic probe, and photoacoustic-ultrasonic system and inspection object imaging apparatus including the ultrasonic probe Keishi Saito, Yasufumi Asao, Katsumi Nakagawa, Shigeru Ichihara 2017-07-04
9689974 Image forming method using ultrasound and aberration correction method Kenichi Nagae, Katsuya Oikawa, Keishi Saito, Yasuyoshi Takai, Hirofumi Taki +1 more 2017-06-27
9439267 Analyte-information acquisition apparatus Toshinobu Tokita 2016-09-06
9271695 Apparatus for mammography with acoustic matching Toshinobu Tokita 2016-03-01
9226662 Photoacoustic apparatus 2016-01-05
8998814 Diagnostic ultrasound apparatus Katsuya Oikawa, Kenichi Nagae 2015-04-07
8997571 Ultrasonic probe, and photoacoustic-ultrasonic system and inspection object imaging apparatus including the ultrasonic probe Keishi Saito, Yasufumi Asao, Katsumi Nakagawa, Shigeru Ichihara 2015-04-07
8747318 Ultrasonic measurement apparatus Tsuyoshi Shiina, Kenichi Nagae, Katsuya Oikawa 2014-06-10
8396534 Intravital-information imaging apparatus Kazuhiko Fukutani, Takao Nakajima, Kenichi Nagae, Yasufumi Asao 2013-03-12
7425714 Measurement method of electron beam current, electron beam writing system and electron beam detector Makoto Sakakibara, Yoshinori Nakayama, Hiroya Ohta, Yasunari Sohda, Noriyuki Tanaka 2008-09-16
7408760 Charged particle beam application system Sayaka Tanimoto, Yasunari Soda, Masakazu Sugaya, Hiroshi Tooyama, Takeshi Tsutsumi 2008-08-05
7378668 Method and apparatus for applying charged particle beam Sayaka Tanimoto, Yasunari Sohda, Masaki Hosoda 2008-05-27
7341393 Mechanism for sealing Masaki Hosoda, Masato Muraki, Mahito Negishi, Koichi Wakizaka, Masakazu Sugaya 2008-03-11
6730916 Electron beam lithography apparatus Hiroshi Tsuji, Mitsuru Inoue, Norio Saitou, Yoshimasa Fukushima 2004-05-04
6583431 Charged particle beam lithography apparatus for forming pattern on semi-conductor Hiroyuki Ito, Yasunari Sohda, Yoshinori Nakayama, Masahide Okumura, Hidetoshi Satoh 2003-06-24
6555833 Charged particle beam lithography apparatus for forming pattern on semi-conductor Hiroyuki Ito, Yasunari Sohda, Yoshinori Nakayama, Masahide Okumura, Hidetoshi Satoh 2003-04-29
6511048 Electron beam lithography apparatus and pattern forming method Yasunari Sohda, Hiroya Ohta, Takashi Matsuzaka, Norio Saitou, Yoshinori Nakayama 2003-01-28
6509572 Charged particle beam lithography apparatus for forming pattern on semi-conductor Hiroyuki Ito, Yasunari Sohda, Yoshinori Nakayama, Masahide Okumura, Hidetoshi Satoh 2003-01-21
6441383 Charged particle beam lithography apparatus for forming pattern on semi-conductor Hiroyuki Ito, Yasunari Sohda, Yoshinori Nakayama, Masahide Okumura, Hidetoshi Satoh 2002-08-27
6329665 Charged particle beam lithography apparatus for forming pattern on semi-conductor Hiroyuki Ito, Yasunari Sohda, Yoshinori Nakayama, Masahide Okumura, Hidetoshi Satoh 2001-12-11
6320198 Charged particle beam lithography apparatus for forming pattern on semi-conductor Hiroyuki Ito, Yasunari Sohda, Yoshinori Nakayama, Masahide Okumura, Hidetoshi Satoh 2001-11-20