Issued Patents All Time
Showing 26–50 of 81 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7525108 | Focused ion beam apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2009-04-28 |
| 7470918 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2008-12-30 |
| 7465945 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2008-12-16 |
| 7435972 | Focused ion beam apparatus and liquid metal ion source | Yuichi Madokoro, Shigeru Izawa, Hiroyasu Kaga | 2008-10-14 |
| 7423825 | Disk unit and manufacturing method thereof | Naoki Shimamura, Osama Takazawa, Kazuhiko Washizu | 2008-09-09 |
| 7420181 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Tohru Ishitani | 2008-09-02 |
| 7397050 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2008-07-08 |
| 7397051 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2008-07-08 |
| 7397052 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2008-07-08 |
| 7368729 | Method, apparatus and system for specimen fabrication by using an ion beam | Hiroyasu Shichi, Muneyuki Fukuda | 2008-05-06 |
| 7268356 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Eiichi Seya, Mitsuo Tokuda +3 more | 2007-09-11 |
| 7242015 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Yusuke Yajima, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe +4 more | 2007-07-10 |
| 7211805 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Tohru Ishitani | 2007-05-01 |
| 7205554 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2007-04-17 |
| 7205560 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu +2 more | 2007-04-17 |
| 7200506 | Method for failure analysis and system for failure analysis | Satoshi Tomimatsu, Hiroyasu Shichi, Muneyuki Fukuda | 2007-04-03 |
| 7189982 | Focused ion beam apparatus and aperture | Yuichi Madokoro, Shigeru Izawa, Hiroyasu Kaga | 2007-03-13 |
| 7176458 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2007-02-13 |
| 7145146 | Micro-spectroscopic measuring device and micro-chemical system | Taro Ogawa, Toshiki Sugawara, Kazuhiko Hosomi, Masataka Shirai, Toshio Katsuyama +3 more | 2006-12-05 |
| 7138628 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2006-11-21 |
| 7095021 | Method, apparatus and system for specimen fabrication by using an ion beam | Hiroyasu Shichi, Muneyuki Fukuda | 2006-08-22 |
| 7071475 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2006-07-04 |
| 7005651 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Tohru Ishitani | 2006-02-28 |
| 6979823 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Yusuke Yajima, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe +4 more | 2005-12-27 |
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Tohru Ishitani, Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Satoshi Tomimatsu +1 more | 2005-11-29 |