Issued Patents All Time
Showing 51–75 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9478392 | Charged particle beam apparatus and image generation method | Kazuki Ikeda, Wen Li, Ryo Kadoi, Hisaaki Kanai, Hiroyuki Takahashi +1 more | 2016-10-25 |
| 9443695 | Charged-particle beam device | Takeyoshi Ohashi, Yasunari Sohda, Noritsugu Takahashi, Osamu Komuro | 2016-09-13 |
| 9368319 | Method for removing foreign substances in charged particle beam device, and charged particle beam device | Kazuma Tanii, Yuji Kasai, Masakazu Takahashi | 2016-06-14 |
| 9368324 | Measurement and inspection device | Wen Li, Hiroyuki Takahashi, Makoto Suzuki | 2016-06-14 |
| 9343878 | Manufacturing method of main metal fitting for spark plug and manufacturing method of spark plug | Koji Kamikawa | 2016-05-17 |
| 9336984 | Charged particle beam device and measuring method using the same | Daisuke Bizen, Hideyuki Kazumi | 2016-05-10 |
| 9312091 | Charged particle beam apparatus | Yasunari Sohda, Tasuku Yano, Muneyuki Fukuda, Noritsugu Takahashi, Hiroyuki Ito | 2016-04-12 |
| 9236220 | Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope | Natsuki Tsuno, Hideyuki Kazumi, Takafumi Miwa, Yoshinobu Kimura | 2016-01-12 |
| 9177759 | Processing apparatus and method using a scanning electron microscope | Wen Li, Ryo Kadoi, Hiroyuki Takahashi | 2015-11-03 |
| 9053905 | Electron beam irradiation apparatus | Shahedul Hoque | 2015-06-09 |
| 9006654 | Charged particle beam apparatus | Soichiro Matsunaga, Souichi Katagiri | 2015-04-14 |
| 8890096 | Measuring/inspecting apparatus and measuring/inspecting method enabling blanking control of electron beam | Wen Li, Hisafumi Imura, Hiroyuki Takahashi | 2014-11-18 |
| 8618499 | Electron beam irradiation apparatus | Shahedul Hoque | 2013-12-31 |
| 8577498 | Automatic transfer method, transfer robot, and automatic transfer system | Takanori Goto, Toru Nakagawa, Tamao Okamoto | 2013-11-05 |
| 8334520 | Charged particle beam apparatus | Tadashi Otaka, Hiroyuki Ito, Ryoichi Ishii, Manabu Yano | 2012-12-18 |
| D663333 | Autonomous mobile robot | Yukihiko Kitano, Shoichi Kobayashi, Mizuho Sakakibara, Tatsuo Sakai, Hiroyuki Uematsu +2 more | 2012-07-10 |
| D663334 | Autonomous mobile robot | Yukihiko Kitano, Shoichi Kobayashi, Mizuho Sakakibara, Tatsuo Sakai, Hiroyuki Uematsu +2 more | 2012-07-10 |
| D644257 | Autonomous mobile robot | Yukihiko Kitano, Shoichi Kobayashi, Mizuho Sakakibara, Rie Takahashi, Tatsuo Sakai +3 more | 2011-08-30 |
| D644256 | Autonomous mobile robot | Yukihiko Kitano, Shoichi Kobayashi, Mizuho Sakakibara, Rie Takahashi, Tatsuo Sakai +3 more | 2011-08-30 |
| 7778776 | Obstacle avoidance method and obstacle-avoidable mobile apparatus | Takanori Goto | 2010-08-17 |
| 6909798 | Method of erasing repeated patterns and pattern defect inspection device | Noriaki Yukawa, Yukihiro Ayaki | 2005-06-21 |
| 6853281 | Magnet apparatus and mri apparatus | Shigeru Kakugawa, Shouji Kitamura, Nobuhiro Hara, Akiyoshi Komura, Noriaki Hino +4 more | 2005-02-08 |
| 6831283 | Charged particle beam drawing apparatus and pattern forming method | Haruo Yoda | 2004-12-14 |
| 6828573 | Electron beam lithography system | Minoru Wakita, Masato Kamada, Haruo Yoda | 2004-12-07 |
| 6816047 | Magnetic resonance imaging apparatus | Hirotaka Takeshima, Shigeru Kakugawa, Noriaki Hino | 2004-11-09 |