Issued Patents All Time
Showing 26–50 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10546718 | High voltage power supply device and charged particle beam device | Takuma Nishimoto, Wen Li, Hiroyuki Takahashi | 2020-01-28 |
| 10546715 | Charged particle beam device | Shahedul Hoque, Yoshinori Momonoi, Hideki ITAI, Minoru Yamazaki, Hiroshi Nishihama | 2020-01-28 |
| 10446359 | Charged particle beam device | Toshiyuki Yokosuka, Hideyuki Kazumi, Yuzuru Mizuhara | 2019-10-15 |
| 10424459 | Charged particle beam device | Wen Li, Ryo Kadoi, Kazuki Ikeda, Hiroyuki Takahashi | 2019-09-24 |
| 10373797 | Charged particle beam device and image forming method using same | Wen Li, Kazuki Ikeda, Hiroyuki Takahashi, Makoto Suzuki | 2019-08-06 |
| 10297419 | Scanning electron microscope with charge density control | Shahedul Hoque | 2019-05-21 |
| 10249474 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Shahedul Hoque, Kumiko Shimizu +1 more | 2019-04-02 |
| 10217604 | Charged particle beam apparatus | Makoto Sakakibara, Makoto Suzuki, Yuji Kasai, Daisuke Bizen, Yoshinori Momonoi | 2019-02-26 |
| 10148070 | Machining apparatus, component producing method, and spark plug producing method | Kimiaki Sato | 2018-12-04 |
| 10134558 | Scanning electron microscope | Yasunari Sohda, Takeyoshi Ohashi, Takafumi Miwa, Noritsugu Takahashi | 2018-11-20 |
| 10121634 | Charged particle beam device and charged particle beam measurement method | Natsuki Tsuno, Yoshinobu Kimura, Hideyuki Kazumi, Junichiro Tomizawa | 2018-11-06 |
| 10116123 | Inspection method and apparatus of spark plug insulator | Shinichiro Kominami | 2018-10-30 |
| 10020160 | Charged particle beam device | Koichi Kuroda, Makoto Suzuki, Yuzuru Mizuhara | 2018-07-10 |
| 10014160 | Scanning electron microscope and method for controlling same | Kaori Shirahata, Daisuke Bizen, Makoto Sakakibara, Yasunari Sohda, Hideyuki Kazumi | 2018-07-03 |
| 9978558 | Scanning-electron-microscope image processing device and scanning method | Kumiko Shimizu | 2018-05-22 |
| 9960006 | Charged-particle-beam device | Noritsugu Takahashi, Yasunari Sohda, Wataru MORI, Yuko Sasaki | 2018-05-01 |
| 9859094 | Charged particle beam apparatus and image forming method of charged particle beam apparatus | Wen Li, Kazuki Ikeda, Takuma Nishimoto, Hiroyuki Takahashi | 2018-01-02 |
| 9799483 | Charged particle beam device and detection method using said device | Tomoyasu Shojo, Yasunari Sohda | 2017-10-24 |
| 9748742 | Apparatus and method for manufacturing spark plug | Takashi Ukimori, Kyosuke Handa | 2017-08-29 |
| 9697987 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Shahedul Hoque, Kumiko Shimizu +1 more | 2017-07-04 |
| 9679740 | Charged particle beam device | Wen Li, Ryo Kadoi, Kazuki Ikeda, Hiroyuki Takahashi | 2017-06-13 |
| 9644955 | Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using same | Tasuku Yano, Yasunari Sohda, Muneyuki Fukuda, Katsunori Onuki, Naomasa Suzuki | 2017-05-09 |
| 9633818 | Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatus | Kazuki Ikeda, Wen Li, Hiroyuki Takahashi, Makoto Suzuki | 2017-04-25 |
| 9543053 | Electron beam equipment | Yasunari Sohda, Takeyoshi Ohashi, Takafumi Miwa | 2017-01-10 |
| 9520266 | Pattern critical dimension measurement equipment and method for measuring pattern critical dimension | Kaori Shirahata, Yasunari Sohda, Makoto Sakakibara, Daisuke Bizen, Hideyuki Kazumi | 2016-12-13 |