KK

Kaushik A. Kumar

IBM: 43 patents #2,123 of 70,183Top 4%
TL Tokyo Electron Limited: 10 patents #748 of 5,567Top 15%
Infineon Technologies Ag: 9 patents #986 of 7,486Top 15%
AM AMD: 1 patents #5,683 of 9,279Top 65%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Clifton Park, NY: #37 of 1,126 inventorsTop 4%
🗺 New York: #1,690 of 115,490 inventorsTop 2%
Overall (All Time): #49,331 of 4,157,543Top 2%
53
Patents All Time

Issued Patents All Time

Showing 26–50 of 53 patents

Patent #TitleCo-InventorsDate
7659616 On-chip cooling systems for integrated circuits Andres Fernando Munoz, Michael Sievers, Richard S. Wise 2010-02-09
7659160 Field effect transistors (FETS) with inverted source/drain metallic contacts, and method of fabrication same Michael P. Belyansky, Dureseti Chidambarrao, Lawrence A. Clevenger, Carl Radens 2010-02-09
7648871 Field effect transistors (FETS) with inverted source/drain metallic contacts, and method of fabricating same Michael P. Belyansky, Dureseti Chidambarrao, Lawrence A. Clevenger, Carl Radens 2010-01-19
7629264 Structure and method for hybrid tungsten copper metal contact Griselda Bonilla, Lawrence A. Clevenger, Stephan Grunow, Kevin S. Petrarca, Roger A. Quon 2009-12-08
7541277 Stress relaxation, selective nitride phase removal Kevin S. Petrarca, John Charles Petrus, Karl W. Barth 2009-06-02
7494915 Back end interconnect with a shaped interface Lawrence A. Clevenger, Andrew P. Cowley, Timothy J. Dalton, Mark Hoinkis, Steffen K. Kaldor +8 more 2009-02-24
7470616 Damascene wiring fabrication methods incorporating dielectric cap etch process with hard mask retention Hakeem S. B. Akinmade-Yusuff, Anthony D. Lisi 2008-12-30
7456099 Method of forming a structure for reducing lateral fringe capacitance in semiconductor devices Lawrence A. Clevenger, Stephan Grunow, Kevin S. Petrarca, Vidhya Ramachandran, Theodorus E. Standaert 2008-11-25
7396758 Polycarbosilane buried etch stops in interconnect structures Elbert E. Huang, Kelly Malone, Dirk Pfeiffer, Muthumanickam Sankarapandian, Christy S. Tyberg 2008-07-08
7397081 Sidewall semiconductor transistors Huilong Zhu, Lawrence A. Clevenger, Omer H. Dokumaci, Carl Radens, Dureseti Chidambarrao 2008-07-08
7358182 Method of forming an interconnect structure Heidi Baks, Shyng-Tsong Chen, Timothy J. Dalton, Nicholas Fuller 2008-04-15
7338895 Method for dual damascene integration of ultra low dielectric constant porous materials Kelly Malone, Christy S. Tyberg 2008-03-04
7253098 Maintaining uniform CMP hard mask thickness Shyng-Tsong Chen, Stephen E. Greco, Shom Ponoth, Terry A. Spooner, David L. Rath +1 more 2007-08-07
7241696 Method for depositing a metal layer on a semiconductor interconnect structure having a capping layer Larry Clevenger, Timothy J. Dalton, Mark Hoinkis, Steffen K. Kaldor, Douglas C. La Tulipe, Jr. +5 more 2007-07-10
7241681 Bilayered metal hardmasks for use in dual damascene etch schemes Lawrence A. Clevenger, Timothy J. Dalton, Douglas C. La Tulipe, Jr., Andy Cowley, Erdem Kaltalioglu +5 more 2007-07-10
7224021 MOSFET with high angle sidewall gate and contacts for reduced miller capacitance Dureseti Chidambarrao, Lawrence A. Clevenger, Omer H. Dokumaci, Huilong Zhu 2007-05-29
7187081 Polycarbosilane buried etch stops in interconnect structures Elbert E. Huang, Kelly Malone, Dirk Pfeiffer, Muthumanickam Sankarapandian, Christy S. Tyberg 2007-03-06
7125792 Dual damascene structure and method Douglas C. La Tulipe, Jr., Timothy J. Dalton, Larry Clevenger, Andy Cowley, Erdem Kaltalioglu +1 more 2006-10-24
7122462 Back end interconnect with a shaped interface Lawrence A. Clevenger, Andrew P. Cowley, Timothy J. Dalton, Mark Hoinkis, Steffen K. Kaldor +8 more 2006-10-17
7091612 Dual damascene structure and method Timothy J. Dalton, Larry Clevenger, Andy Cowley, Douglas C. La Tulipe, Jr., Mark Hoinkis +5 more 2006-08-15
7084479 Line level air gaps Shyng-Tsong Chen, Stefanie Chiras, Matthew E. Colburn, Timothy J. Dalton, Jeffrey Hedrick +9 more 2006-08-01
7064064 Copper recess process with application to selective capping and electroless plating Shyng-Tsong Chen, Timothy J. Dalton, Kenneth M. Davis, Chao-Kun Hu, Fen F. Jamin +11 more 2006-06-20
7057287 Dual damascene integration of ultra low dielectric constant porous materials Kelly Malone, Christy S. Tyberg 2006-06-06
7052621 Bilayered metal hardmasks for use in Dual Damascene etch schemes Lawrence A. Clevenger, Timothy J. Dalton, Douglas C. La Tulipe, Jr., Andy Cowley, Erdem Kaltalioglu +5 more 2006-05-30
7049209 De-fluorination of wafer surface and related structure Timothy J. Dalton, Nicholas Fuller, Catherine B. Labelle 2006-05-23