DR

David L. Rath

IBM: 74 patents #956 of 70,183Top 2%
Infineon Technologies Ag: 5 patents #2,452 of 7,486Top 35%
AM AMD: 2 patents #3,994 of 9,279Top 45%
TE Tessera: 1 patents #207 of 271Top 80%
Overall (All Time): #24,911 of 4,157,543Top 1%
76
Patents All Time

Issued Patents All Time

Showing 25 most recent of 76 patents

Patent #TitleCo-InventorsDate
12048254 Sacrificial material facilitating protection of a substrate in a qubit device Vivekananda P. Adiga, Martin O. Sandberg, Jeng-Bang Yau, John Bruley, Cihan Kurter +2 more 2024-07-23
11857997 Metal surface protection Ali Afzali-Ardakani, Sarunya Bangsaruntip, George G. Totir 2024-01-02
11575077 Microfabricated air bridges for quantum circuits Vivekananda P. Adiga, Hongwen Yan, John M. Papalia, Jyotica V. Patel 2023-02-07
11316154 High throughput insulation of 3D in-silicon high volumetric energy and power dense energy storage devices John Collins, John M. Papalia, Devendra K. Sadana 2022-04-26
11276767 Additive core subtractive liner for metal cut etch processes Ruqiang Bao, Kisup Chung, Andrew M. Greene, Sivananda K. Kanakasabapathy, Indira Seshadri +1 more 2022-03-15
11152489 Additive core subtractive liner for metal cut etch processes Ruqiang Bao, Kisup Chung, Andrew M. Greene, Sivananda K. Kanakasabapathy, Indira Seshadri +1 more 2021-10-19
11094873 Transmon qubits with self defined junctions Vivekananda P. Adiga, Martin O. Sandberg 2021-08-17
11075281 Additive core subtractive liner for metal cut etch processes Ruqiang Bao, Kisup Chung, Andrew M. Greene, Sivananda K. Kanakasabapathy, Indira Seshadri +1 more 2021-07-27
11024512 Selective etch formulation for silicon oxide Ali Afzali-Ardakani, Benjamin Wymore, George G. Totir 2021-06-01
10672707 Low aspect ratio interconnect Benjamin D. Briggs, Elbert E. Huang, Raghuveer R. Patlolla, Cornelius Brown Peethala, Chih-Chao Yang 2020-06-02
10607933 Interconnect structures with fully aligned vias Daniel C. Edelstein, Nicholas C. M. Fuller, Elbert E. Huang, Satyanarayana V. Nitta 2020-03-31
10600884 Additive core subtractive liner for metal cut etch processes Ruqiang Bao, Kisup Chung, Andrew M. Greene, Sivananda K. Kanakasabapathy, Indira Seshadri +1 more 2020-03-24
10242909 Wet etch removal of Ru selective to other metals Benjamin D. Briggs, Cornelius Brown Peethala 2019-03-26
10211153 Low aspect ratio interconnect Benjamin D. Briggs, Elbert E. Huang, Raghuveer R. Patlolla, Cornelius Brown Peethala, Chih-Chao Yang 2019-02-19
10204856 Interconnect structures with fully aligned vias Daniel C. Edelstein, Nicholas C. M. Fuller, Elbert E. Huang, Satyanarayana V. Nitta 2019-02-12
10170644 Processes for uniform metal semiconductor alloy formation for front side contact metallization and photovoltaic device formed therefrom Kathryn C. Fisher, Qiang Huang, Satyavolu S. Papa Rao 2019-01-01
10090247 Semiconductor device formed by wet etch removal of Ru selective to other metals Benjamin D. Briggs, Cornelius Brown Peethala 2018-10-02
10074562 Self aligned contact structure Rosa A. Orozco-Teran, Ravikumar Ramachandran, John A. Fitzsimmons, Russell H. Arndt 2018-09-11
10049802 Patterning magnetic films using self-stop electro-etching Eugene J. O'Sullivan, Naigang Wang 2018-08-14
10043663 Enhanced defect reduction for heteroepitaxy by seed shape engineering Cheng-Wei Cheng, Devendra K. Sadana, Kuen-Ting Shiu, Brent A. Wacaser 2018-08-07
10002831 Selective and non-selective barrier layer wet removal Benjamin D. Briggs, Elbert E. Huang, Raghuveer R. Patlolla, Cornelius Brown Peethala, Hosadurga Shobha 2018-06-19
9911690 Interconnect structures with fully aligned vias Daniel C. Edelstein, Nicholas C. M. Fuller, Elbert E. Huang, Satyanarayana V. Nitta 2018-03-06
9881833 Barrier planarization for interconnect metallization Benjamin D. Briggs, Elbert E. Huang, Takeshi Nogami, Raghuveer R. Patlolla, Cornelius Brown Peethala 2018-01-30
9806023 Selective and non-selective barrier layer wet removal Benjamin D. Briggs, Elbert E. Huang, Raghuveer R. Patlolla, Cornelius Brown Peethala, Hosadurga Shobha 2017-10-31
9735224 Patterning magnetic films using self-stop electro-etching Eugene J. O'Sullivan, Naigang Wang 2017-08-15