JF

John A. Fitzsimmons

IBM: 84 patents #777 of 70,183Top 2%
Globalfoundries: 13 patents #279 of 4,424Top 7%
Infineon Technologies Ag: 5 patents #2,021 of 7,486Top 30%
AC Advanced Technology & Materials Co.: 1 patents #255 of 410Top 65%
IN Intermolecular: 1 patents #186 of 248Top 75%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
GP Globalfoundries Singapore Pte.: 1 patents #427 of 828Top 55%
📍 Poughkeepsie, NY: #24 of 1,613 inventorsTop 2%
🗺 New York: #534 of 115,490 inventorsTop 1%
Overall (All Time): #14,271 of 4,157,543Top 1%
101
Patents All Time

Issued Patents All Time

Showing 51–75 of 101 patents

Patent #TitleCo-InventorsDate
8288271 Method for reworking antireflective coating over semiconductor substrate Hakeem Akinmade Yusuff, Ranee W. Kwong 2012-10-16
8236610 Forming semiconductor chip connections Louis L. Hsu, Kangguo Cheng, Timothy J. Dalton, Mukta G. Farooq 2012-08-07
8129286 Reducing effective dielectric constant in semiconductor devices Daniel C. Edelstein, Matthew E. Colburn, Edward C. Cooney, III, Timothy J. Dalton, Jeffrey P. Gambino +10 more 2012-03-06
8018061 Integrated circuit hard mask processing system Wuping Liu, Michael Beck 2011-09-13
7892940 Device and methodology for reducing effective dielectric constant in semiconductor devices Daniel C. Edelstein, Matthew E. Colburn, Edward C. Cooney, III, Timothy J. Dalton, Jeffrey P. Gambino +10 more 2011-02-22
7755206 Pad structure to provide improved stress relief Mukta G. Farooq, Thomas J. Fleischman 2010-07-13
7709344 Integrated circuit fabrication process using gas cluster ion beam etching Shyng-Tsong Chen, Shom Ponoth, Terry A. Spooner 2010-05-04
7691736 Minimizing low-k dielectric damage during plasma processing Michael Beck, Karl Hornik, Darryl D. Restaino 2010-04-06
7670497 Oxidant and passivant composition and method for use in treating a microelectronic structure David L. Rath, Shom Ponoth, Michael Beck 2010-03-02
7615484 Integrated circuit manufacturing method using hard mask Wuping Liu, Michael Beck 2009-11-10
7592685 Device and methodology for reducing effective dielectric constant in semiconductor devices Daniel C. Edelstein, Matthew E. Colburn, Edward C. Cooney, III, Timothy J. Dalton, Jeffrey P. Gambino +10 more 2009-09-22
7566649 Compressible films surrounding solder connectors William E. Bernier, Tien-Jen Cheng, Marie Cole, David E. Eichstadt, Mukta G. Farooq +4 more 2009-07-28
7541679 Exposed pore sealing post patterning Edward C. Cooney, III, Jeffrey P. Gambino, Stephen E. Luce, Thomas L. McDevitt, Lee M. Nicholson +1 more 2009-06-02
7517790 Method and structure to enhance temperature/humidity/bias performance of semiconductor devices by surface modification Stephen M. Gates, Michael Lane, Eric G. Liniger 2009-04-14
7517736 Structure and method of chemically formed anchored metallic vias Sanjay C. Mehta, Daniel C. Edelstein, Stephan Grunow, Henry A. Nye, III, David L. Rath 2009-04-14
7488679 Interconnect structure and process of making the same Theodorus E. Standaert, Pegeen M. Davis, Stephen E. Greco, Tze-man Ko, Naftali E. Lustig +2 more 2009-02-10
7480990 Method of making conductor contacts having enhanced reliability William J. Cote, Nancy Anne Greco, Thomas Ivers, Steven Moskowitz 2009-01-27
7473159 Detection of diamond contamination in polishing pad and reconditioning system therefor Laertis Economikos 2009-01-06
7405147 Device and methodology for reducing effective dielectric constant in semiconductor devices Daniel C. Edelstein, Matthew E. Colburn, Edward C. Cooney, III, Timothy J. Dalton, Jeffrey P. Gambino +10 more 2008-07-29
7354333 Detection of diamond contamination in polishing pad Laertis Economikos 2008-04-08
7341948 Method of making a semiconductor structure with a plating enhancement layer Shom Ponoth, Steven S. Chen, Terry A. Spooner 2008-03-11
7332821 Compressible films surrounding solder connectors William E. Bernier, Tien-Jen Cheng, Marie Cole, David E. Eichstadt, Mukta G. Farooq +4 more 2008-02-19
7327033 Copper alloy via bottom liner Daniel C. Edelstein, Edward C. Cooney, III, Jeffrey P. Gambino, Anthony K. Stamper 2008-02-05
7180187 Interlayer connector for preventing delamination of semiconductor device Jeffrey P. Gambino, Anthony K. Stamper 2007-02-20
7135398 Reliable low-k interconnect structure with hybrid dielectric Stephen E. Greco, Jia Lee, Stephen M. Gates, Terry A. Spooner, Matthew S. Angyal +3 more 2006-11-14