EP

Engelbertus Antonius Fransiscus Van Der Pasch

AB Asml Netherlands B.V.: 88 patents #23 of 3,192Top 1%
CG Carl Zeiss Smt Gmbh: 2 patents #466 of 1,189Top 40%
📍 Oirschot, NL: #2 of 38 inventorsTop 6%
Overall (All Time): #17,852 of 4,157,543Top 1%
90
Patents All Time

Issued Patents All Time

Showing 51–75 of 90 patents

Patent #TitleCo-InventorsDate
8614783 Encoder-type measurement system, lithographic apparatus and method to detect an error on or in a grid or grating of an encoder-type measurement system Emiel Jozef Melanie Eussen, Robbert Edgar Van Leeuwen, Renatus Gerardus Klaver, Martijn Robert Hamers 2013-12-24
8570492 Lithographic apparatus Emiel Jozef Melanie Eussen, Johannes Henricus Wilhelmus Jacobs, Joost Jeroen Ottens, Frank Staals, Lukasz Jerzy Macht +2 more 2013-10-29
8482719 Positioning system, lithographic apparatus and method Jan Van Eijk, Johannes Petrus Martinus Bernardus Vermeulen 2013-07-09
8457385 Measurement system and lithographic apparatus for measuring a position dependent signal of a movable object Marc Wilhelmus Maria Van Der Wijst, Koen Jacobus Johannes Maria Zaal 2013-06-04
8451454 Stage system, lithographic apparatus including such stage system, and correction method Willem Herman Gertruda Anna Koenen, Emiel Jozef Melanie Eussen 2013-05-28
8446567 Stage system calibration method, stage system and lithographic apparatus comprising an encoder measurement system to measure position of stage system Hans Butler 2013-05-21
8400617 Lithographic apparatus having a substrate support with open cell plastic foam parts Dirk-Jan Bijvoet, Emiel Jozef Melanie Eussen, Igor Matheus Petronella Aarts 2013-03-19
8390820 Displacement measurement system having a prism, for displacement measurement between two or more gratings Renatus Gerardus Klaver, Erik Roelof Loopstra 2013-03-05
8368868 Lithographic apparatus with gas pressure means for controlling a planar position of a patterning device contactless Johannes Petrus Martinus Bernardus Vermeulen, Marcel Koenraad Marie Baggen, Hans Butler, Henrikus Herman Marie Cox, Jan Van Eijk +7 more 2013-02-05
8334983 Lithographic apparatus and device manufacturing method Ruud Antonius Catharina Maria Beerens, Sjoerd Nicolaas Lambertus Donders, Johannes Petrus Martinus Bernardus Vermeulen, Fransiscus Mathijs Jacobs 2012-12-18
8319940 Position measurement system and lithographic apparatus Hans Butler 2012-11-27
8279407 Stage system and lithographic apparatus comprising such stage system Ramidin Izair Kamidi, Henrikus Herman Marie Cox, Emiel Jozef Melanie Eussen, Ronald Casper Kunst, Marcel François Heertjes +1 more 2012-10-02
8264671 Lithographic apparatus and device manufacturing method Igor Matheus Petronella Aarts, Johan Geerke, Frederik Eduard De Jong, Marc Van De Grift 2012-09-11
8248583 Lithographic apparatus and calibration method Marinus Aart Van Den Brink, Hans Butler, Emiel Jozef Melanie Eussen, Marc Wilhelmus Maria Van Der Wijst, Georgo Angelis +4 more 2012-08-21
8174671 Lithographic projection apparatus and method for controlling a support structure Erik Roelof Loopstra, Emiel Jozef Melanie Eussen, Willem Herman Gertruda Anna Koenen, Marc Wilhelmus Maria Van Der Wijst 2012-05-08
7999912 Lithographic apparatus and sensor calibration method Emiel Jozef Melanie Eussen, Stefan Gertrud Marie Hendriks, Erik Roelof Loopstra, Jacob Willem Vink, Ruud Antonius Catharina Maria Beerens +2 more 2011-08-16
7903866 Measurement system, lithographic apparatus and method for measuring a position dependent signal of a movable object Marc Wilhelmus Maria Van Der Wijst, Koen Jacobus Johannes Maria Zaal 2011-03-08
7804584 Integrated circuit manufacturing methods with patterning device position determination Petrus Rutgerus Bartray, Wilhelmus Josephus Box, Dominicus Jacobus Petrus Adrianus Franken, Bernardus Antonius Johannes Luttikhuis, Marc Wilhelmus Maria Van Der Wijst +1 more 2010-09-28
7636165 Displacement measurement systems lithographic apparatus and device manufacturing method Renatus Gerardus Klaver, Erik Roelof Loopstra 2009-12-22
7619207 Lithographic apparatus and device manufacturing method Erik Roelof Loopstra, Emiel Jozef Melanie Eussen, Onno Bram Loopstra 2009-11-17
7602489 Lithographic apparatus and device manufacturing method Emiel Jozef Melanie Eussen 2009-10-13
7599043 Position measurement system and lithographic apparatus Wouter Onno Pril, Emiel Jozef Melanie Eussen 2009-10-06
7557903 Lithographic apparatus and device manufacturing method Carolus Johannes Catharina Schoormans, Emiel Jozef Melanie Eussen, Willem Herman Gertruda Anna Koenen, Nicolas Lallemant, Johannes Mathias Theodorus Antonius Adriaens 2009-07-07
7515281 Lithographic apparatus and device manufacturing method Erik Roelof Loopstra 2009-04-07
7483120 Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method Bernardus Antonius Johannes Luttikhuis, Henrikus Herman Marie Cox, Erik Roelof Loopstra, Harmen Klaas Van Der Schoot 2009-01-27