MB

Marinus Aart Van Den Brink

AB Asml Netherlands B.V.: 16 patents #273 of 3,192Top 9%
AB Asm Lithography B.V.: 5 patents #1 of 53Top 2%
AL Asm Lithography: 3 patents #1 of 15Top 7%
U.S. Philips: 2 patents #2,537 of 8,851Top 30%
📍 Moergestel, NL: #2 of 16 inventorsTop 15%
Overall (All Time): #160,130 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
12099306 Method for controlling a lithographic system Oscar Franciscus Jozephus Noordman, Antonius Theodorus Wilhelmus Kempen, Jan Bernard Plechelmus Van Schoot 2024-09-24
12093632 Machine learning based inverse optical proximity correction and process model calibration Yu Cao, Yi Zou 2024-09-17
11875966 Method and apparatus for inspection Bernardo Kastrup, Johannes Catharinus Hubertus Mulkens, Jozef Petrus Henricus Benschop, Erwin Paul SMAKMAN, Tamara Druzhinina +1 more 2024-01-16
11544440 Machine learning based inverse optical proximity correction and process model calibration Yu Cao, Yi Zou 2023-01-03
11094502 Method and apparatus for inspection Bernardo Kastrup, Johannes Catharinus Hubertus Mulkens, Jozef Petrus Henricus Benschop, Erwin Paul SMAKMAN, Tamara Druzhinina +1 more 2021-08-17
RE47943 Dual stage lithographic apparatus and device manufacturing method Jozef Petrus Henricus Benschop, Erik Roelof Loopstra 2020-04-14
10268128 Lithographic apparatus Franciscus Johannes Joseph Janssen, Johannes Paul Marie De La Rosette, Edwin Cornelis Kadijk, Nicolas Lallemant, Jan Liefooghe +4 more 2019-04-23
RE46933 Dual stage lithographic apparatus and device manufacturing method Jozef Petrus Henricus Benschop, Erik Roelof Loopstra 2018-07-03
RE45576 Dual stage lithographic apparatus and device manufacturing method Jozef Petrus Henricus Benschop, Erik Roelof Loopstra 2015-06-23
8514365 Lithographic apparatus and device manufacturing method Frederik Eduard De Jong, Marcel Hendrikus Maria Beems, Johannes Henricus Wilhelmus Jacobs, Martinus Hendrikus Antonius Leenders, Leon Martin Levasier +10 more 2013-08-20
RE44446 Dual stage lithographic apparatus and device manufacturing method Joezf Petrus Henricus Benschop, Erik Roelof Loopstra 2013-08-20
8248583 Lithographic apparatus and calibration method Hans Butler, Emiel Jozef Melanie Eussen, Engelbertus Antonius Fransiscus Van Der Pasch, Marc Wilhelmus Maria Van Der Wijst, Georgo Angelis +4 more 2012-08-21
RE43576 Dual stage lithographic apparatus and device manufacturing method Jozef Petrus Henricus Benschop, Erik Roelof Loopstra 2012-08-14
7589818 Lithographic apparatus, alignment apparatus, device manufacturing method, and a method of converting an apparatus Johannes Catharinus Hubertus Mulkens, Erik Roelof Loopstra 2009-09-15
7161659 Dual stage lithographic apparatus and device manufacturing method Jozef Petrus Henricus Benschop, Erik Roelof Loopstra 2007-01-09
7046331 Lithographic apparatus, device manufacturing method, and device manufactured thereby Harm Rossing, Richard Alexander George 2006-05-16
6239862 Photolithographic apparatus Johannes Catharinus Hubertus Mulkens, Johannes Christiaan Maria Jasper 2001-05-29
6084673 Lithographic apparatus for step-and-scan imaging of mask pattern with interferometer mirrors on the mask and wafer holders Alexander Straaijer 2000-07-04
6067146 Photolithographic apparatus Johannes Catharinus Hubertus Mulkens, Johannes Christiaan Maria Jasper 2000-05-23
5801832 Method of and device for repetitively imaging a mask pattern on a substrate using five measuring axes 1998-09-01
5481362 Apparatus for projecting a mask pattern on a substrate Henk F. D. Linders, Stefan Wittekoek 1996-01-02
5191200 Imaging apparatus having a focus-error and/or tilt detection device Jan Evert Van Der Werf, Henk F. D. Linders, Johannes Marcus Maria Beltman 1993-03-02
5144363 Apparatus for and method of projecting a mask pattern on a substrate Stefan Wittekoek, Theodorus A. Fahner 1992-09-01
5100237 Apparatus for projecting a mask pattern on a substrate Stefan Wittekoek 1992-03-31
4746800 Positioning device comprising a z-manipulator and a .theta.-manipulator Jan Van Eijk, Johannes M. M. Van Kimmenade, Hubert A. M. Neilen 1988-05-24