TG

Tahir Ghani

IN Intel: 469 patents #7 of 30,777Top 1%
SO Sony: 6 patents #6,793 of 25,231Top 30%
TR Tahoe Research: 4 patents #1 of 215Top 1%
DP Daedalus Prime: 3 patents #3 of 21Top 15%
📍 Portland, OR: #4 of 9,213 inventorsTop 1%
🗺 Oregon: #10 of 28,073 inventorsTop 1%
Overall (All Time): #420 of 4,157,543Top 1%
482
Patents All Time

Issued Patents All Time

Showing 276–300 of 482 patents

Patent #TitleCo-InventorsDate
11043492 Self-aligned gate edge trigate and finFET devices Szuya S. Liao, Biswajeet Guha, Christopher KENYON, Leonard P. GULER 2021-06-22
11031487 Contact over active gate structures for advanced integrated circuit structure fabrication Andrew W. Yeoh, Atul MADHAVAN, Michael L. Hattendorf, Christopher P. Auth 2021-06-08
11024713 Gradient doping to lower leakage in low band gap material devices Seung Hoon Sung, Dipanjan Basu, Glenn A. Glass, Harold W. Kennel, Ashish Agrawal +3 more 2021-06-01
11018264 Three-dimensional nanoribbon-based logic Wilfred Gomes, Kinyip Phoa, Rajesh Kumar 2021-05-25
11011550 Self-aligned top-gated non-planar oxide semiconductor thin film transistors Van H. Le, Abhishek A. Sharma, Gilbert Dewey, Ravi Pillarisetty, Shriram Shivaraman +1 more 2021-05-18
11004982 Gate for a transistor Van H. Le, Abhishek A. Sharma, Ravi Pillarisetty, Gilbert Dewey, Shriram Shivaraman +2 more 2021-05-11
11004954 Epitaxial buffer to reduce sub-channel leakage in MOS transistors Karthik Jambunathan, Glenn A. Glass, Anand S. Murthy, Jack T. Kavalieros, Seung Hoon Sung +1 more 2021-05-11
11004739 Gate contact structure over active gate and method to fabricate same Abhijit Jayant Pethe, Mark Bohr, Clair Webb, Harry Gomez, Annalisa Cappellani 2021-05-11
10985263 Thin film cap to lower leakage in low band gap material devices Seung Hoon Sung, Dipanjan Basu, Ashish Agrawal, Van H. Le, Benjamin Chu-Kung +4 more 2021-04-20
10985267 Fin trim isolation with single gate spacing for advanced integrated circuit structure fabrication Byron Ho, Michael L. Hattendorf, Christopher P. Auth 2021-04-20
10985184 Fins for metal oxide semiconductor device structures Martin D. Giles 2021-04-20
10978568 Passivation of transistor channel region interfaces Glenn A. Glass, Mark R. Brazier, Anand S. Murthy, Owen Loh 2021-04-13
10964697 Non-planar semiconductor device having doped sub-fin region and method to fabricate same Salman Latif, Chanaka D. Munasinghe 2021-03-30
10957796 Semiconductor device having doped epitaxial region and its methods of fabrication Anand S. Murthy, Daniel Bourne Aubertine, Abhijit Jayant Pethe 2021-03-23
10957769 High-mobility field effect transistors with wide bandgap fin cladding Sean T. Ma, Chandra S. Mohapatra, Gilbert Dewey, Willy Rachmady, Harold W. Kennel +3 more 2021-03-23
10930679 Thin film transistors with a crystalline oxide semiconductor source/drain Gilbert Dewey, Abhishek A. Sharma, Shriram Shivaraman, Van H. Le, Ravi Pillarisetty 2021-02-23
10930753 Trench isolation for advanced integrated circuit structure fabrication Michael L. Hattendorf, Curtis W. Ward, Heidi M. Meyer, Christopher P. Auth 2021-02-23
10930738 Sub-fin leakage control in semicondcutor devices Dipanjan Basu, Seung Hoon Sung, Glenn A. Glass, Jack T. Kavalieros 2021-02-23
10930557 Self-aligned contacts Mark Bohr, Nadia M. Rahhal-Orabi, Subhash M. Joshi, Joseph M. Steigerwald, Jason W. Klaus +2 more 2021-02-23
10910265 Gate aligned contact and method to fabricate same Oleg Golonzka, Swaminathan Sivakumar, Charles H. Wallace 2021-02-02
10903364 Semiconductor device with released source and drain Willy Rachmady, Sanaz K. Gardner, Chandra S. Mohapatra, Matthew V. Metz, Gilbert Dewey +3 more 2021-01-26
10896963 Semiconductor device contacts with increased contact area Rishabh Mehandru, Szuya S. Liao 2021-01-19
10892335 Device isolation by fixed charge Sean T. Ma, Willy Rachmady, Gilbert Dewey, Aaron D. Lilak, Justin R. Weber +5 more 2021-01-12
10886272 Techniques for forming dual-strain fins for co-integrated n-MOS and p-MOS devices Stephen M. Cea, Rishabh Mehandru, Anupama Bowonder, Anand S. Murthy 2021-01-05
10886408 Group III-V material transistors employing nitride-based dopant diffusion barrier layer Chandra S. Mohapatra, Harold W. Kennel, Glenn A. Glass, Willy Rachmady, Anand S. Murthy +4 more 2021-01-05