SG

Stephen E. Greco

IBM: 60 patents #1,306 of 70,183Top 2%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
MG Mentor Graphics: 2 patents #191 of 698Top 30%
UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
Infineon Technologies Ag: 1 patents #168 of 446Top 40%
📍 Lagrangeville, NY: #8 of 200 inventorsTop 4%
🗺 New York: #1,217 of 115,490 inventorsTop 2%
Overall (All Time): #33,892 of 4,157,543Top 1%
65
Patents All Time

Issued Patents All Time

Showing 26–50 of 65 patents

Patent #TitleCo-InventorsDate
7949981 Via density change to improve wafer surface planarity 2011-05-24
7941780 Intersect area based ground rule for semiconductor design Albrik Avanessian, Henry A. Bonges, III, Dureseti Chidambarrao, Douglas W. Kemerer, Tina Wagner 2011-05-10
7701035 Laser fuse structures for high power applications Erik L. Hedberg, Dae Young Jung, Paul S. McLaughlin, Christopher D. Muzzy, Norman J. Rohrer +1 more 2010-04-20
7645700 Dry etchback of interconnect contacts Theodorus E. Standaert, William Brearley, Sujatha Sankaran 2010-01-12
7612371 Structure to monitor arcing in the processing steps of metal layer build on silicon-on-insulator semiconductors Ishtiaq Ahsan, Christine Mary Bunke 2009-11-03
7488679 Interconnect structure and process of making the same Theodorus E. Standaert, Pegeen M. Davis, John A. Fitzsimmons, Tze-man Ko, Naftali E. Lustig +2 more 2009-02-10
7456501 Semiconductor structure having recess with conductive metal Cyprian Emeka Uzoh 2008-11-25
7439173 Increasing electromigration lifetime and current density in IC using vertically upwardly extending dummy via Chao-Kun Hu, Paul S. McLaughlin 2008-10-21
7390615 Integrated circuit fuse and method of opening 2008-06-24
7368302 Dynamic metal fill for correcting non-planar region 2008-05-06
7323410 Dry etchback of interconnect contacts Theodorus E. Standaert, William Brearley, Sujatha Sankaran 2008-01-29
7300825 Customizing back end of the line interconnects Nancy Anne Greco, Erik L. Hedberg 2007-11-27
7301236 Increasing electromigration lifetime and current density in IC using vertically upwardly extending dummy via Chao-Kun Hu, Paul S. McLaughlin 2007-11-27
7253098 Maintaining uniform CMP hard mask thickness Shyng-Tsong Chen, Kaushik A. Kumar, Shom Ponoth, Terry A. Spooner, David L. Rath +1 more 2007-08-07
7135398 Reliable low-k interconnect structure with hybrid dielectric John A. Fitzsimmons, Jia Lee, Stephen M. Gates, Terry A. Spooner, Matthew S. Angyal +3 more 2006-11-14
7101784 Method to generate porous organic dielectric Lawrence A. Clevenger, Keith Kwietniak, Soon-Cheon Seo, Chih-Chao Yang, Yun-Yu Wang +1 more 2006-09-05
7071099 Forming of local and global wiring for semiconductor product Theodorus E. Standaert 2006-07-04
6921978 Method to generate porous organic dielectric Lawrence A. Clevenger, Keith Kwietniak, Soon-Cheon Seo, Chih-Chao Yang, Yun-Yu Wang +1 more 2005-07-26
6917108 Reliable low-k interconnect structure with hybrid dielectric John A. Fitzsimmons, Jia Lee, Stephen M. Gates, Terry A. Spooner, Matthew S. Angyal +3 more 2005-07-12
6831364 Method for forming a porous dielectric material layer in a semiconductor device and device formed Timothy J. Dalton, Jeffrey Hedrick, Satyanarayana V. Nitta, Sampath Purushothaman, Kenneth P. Rodbell +1 more 2004-12-14
6784105 Simultaneous native oxide removal and metal neutral deposition method Chih-Chao Yang, Yun-Yu Wang, Larry Clevenger, Andrew H. Simon, Kaushik Chanda +3 more 2004-08-31
6734096 Fine-pitch device lithography using a sacrificial hardmask Timothy J. Dalton, Minakshisundaran Balasubramanian Anand, Michael D. Armacost, Shyng-Tsong Chen, Stephen M. Gates +2 more 2004-05-11
6727589 Dual damascene flowable oxide insulation structure and metallic barrier John P. Hummel, Joyce C. Liu, Vincent J. McGahay, Rebecca D. Mih, Kamalesh K. Srivastava 2004-04-27
6573606 Chip to wiring interface with single metal alloy layer applied to surface of copper interconnect Carlos J. Sambucetti, Xiaomeng Chen, Soon-Cheon Seo, Birenda Nath Agarwala, Chao-Kun Hu +1 more 2003-06-03
6479884 Interim oxidation of silsesquioxane dielectric for dual damascene process Robert Cook, John P. Hummel, Joyce C. Liu, Vincent J. McGahay, Rebecca D. Mih +1 more 2002-11-12