SG

Stephen E. Greco

IBM: 60 patents #1,306 of 70,183Top 2%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
MG Mentor Graphics: 2 patents #191 of 698Top 30%
UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
Infineon Technologies Ag: 1 patents #168 of 446Top 40%
📍 Lagrangeville, NY: #8 of 200 inventorsTop 4%
🗺 New York: #1,217 of 115,490 inventorsTop 2%
Overall (All Time): #33,892 of 4,157,543Top 1%
65
Patents All Time

Issued Patents All Time

Showing 51–65 of 65 patents

Patent #TitleCo-InventorsDate
6451712 Method for forming a porous dielectric material layer in a semiconductor device and device formed Timothy J. Dalton, Jeffrey Hedrick, Satyanarayana V. Nitta, Sampath Purushothaman, Kenneth P. Rodbell +1 more 2002-09-17
6348736 In situ formation of protective layer on silsesquioxane dielectric for dual damascene process Vincent J. McGahay, John P. Hummel, Joyce C. Liu, Rebecca D. Mih, Kamalesh K. Srivastava +1 more 2002-02-19
6339022 Method of annealing copper metallurgy Arne Ballantine, Edward C. Cooney, III, George A. Dunbar, III, Cheryl G. Faltermeier, Jeffrey D. Gilbert +9 more 2002-01-15
6329280 Interim oxidation of silsesquioxane dielectric for dual damascene process Robert Cook, John P. Hummel, Joyce C. Liu, Vincent J. McGahay, Rebecca D. Mih +1 more 2001-12-11
6221780 Dual damascene flowable oxide insulation structure and metallic barrier John P. Hummel, Joyce C. Liu, Vincent J. McGahay, Rebecca D. Mih, Kamalesh K. Srivastava 2001-04-24
6174814 Method for producing a crack stop for interlevel dielectric layers Robert Cook, Eduardo Garcia, Nancy Anne Greco, Ernest N. Levine 2001-01-16
6140234 Method to selectively fill recesses with conductive metal Cyprian Emeka Uzoh 2000-10-31
6121129 Method of contact structure formation Nancy Anne Greco, Tina Wagner 2000-09-19
6091131 Integrated circuit having crack stop for interlevel dielectric layers Robert Cook, Eduardo Garcia, Nancy Anne Greco, Ernest N. Levine 2000-07-18
5928960 Process for reducing pattern factor effects in CMP planarization Nancy Anne Greco 1999-07-27
5530290 Large scale IC personalization method employing air dielectric structure for extended conductor John M. Aitken, Klaus D. Beyer, Billy L. Crowder 1996-06-25
5444015 Larce scale IC personalization method employing air dielectric structure for extended conductors John M. Aitken, Klaus D. Beyer, Billy L. Crowder 1995-08-22
5371047 Chip interconnection having a breathable etch stop layer Kris V. Srikrishnan 1994-12-06
4997746 Method of forming conductive lines and studs Nancy Anne Greco 1991-03-05
4600683 Cross-linked polyalkenyl phenol based photoresist compositions Dennis C. Green 1986-07-15