Issued Patents All Time
Showing 251–275 of 468 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6834174 | Image forming apparatus and rotary body detection device | Chikara Imaizumi, Seiji Obata, Takayuki Miyamoto | 2004-12-21 |
| 6832066 | Image forming apparatus driving conveying medium or intermediate transferring medium and control method therefor | Shigeru Kameyama | 2004-12-14 |
| 6820864 | Fuel vaporization promoting apparatus and fuel carburetion accelerator | Kiyoshi Amou, Yuzo Kadomukai, Hiroaki Saeki, Takanobu Ichihara, Masami Nagano | 2004-11-23 |
| 6797975 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Akira Hamamatsu, Tetsuya Watanabe +1 more | 2004-09-28 |
| 6788433 | Character information processor | Tomoyuki Ichikawa, Kenichi Tanabe, Shinichi Tsukagoshi, Masahiko Nunokawa | 2004-09-07 |
| 6777677 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Hidetoshi Nishiyama, Shigeaki Hijikata, Koji Abe | 2004-08-17 |
| 6755371 | Film winding method, film winding apparatus, and film manufacturing apparatus | Akio Hiroi, Fujio Kuwabara | 2004-06-29 |
| 6756589 | Method for observing specimen and device therefor | Kenji Obara, Yuji Takagi, Atsushi Shimoda, Ryou Nakagaki, Seiji Isogai +3 more | 2004-06-29 |
| 6757621 | Process management system | Fumio Mizuno, Seiji Isogai, Yasuhiro Yoshitake, Terushige Asakawa, Yuichi Ohyama +12 more | 2004-06-29 |
| 6720541 | High frequency heating apparatus with temperature detection means | Kazuo Fujishita, Tomotaka Nobue, Takesi Takizaki, Isao Mizuta, Akemi Fukumoto | 2004-04-13 |
| 6709166 | Connector assembly with multi-part housing | Akihiro Miyachi, Masashi Seto, Kazuhiro Shimada, Hideo Tamura | 2004-03-23 |
| 6703850 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Keiichi Saiki, Aritoshi Sugimoto, Hiroshi Morioka +2 more | 2004-03-09 |
| 6690469 | Method and apparatus for observing and inspecting defects | Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida +1 more | 2004-02-10 |
| 6657738 | Apparatus and method for processing character information | Takanobu Kameda, Tomoyuki Shimmura, Hitoshi Hayama | 2003-12-02 |
| 6650409 | Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system | Minori Noguchi, Yukio Kembo, Hiroshi Morioka, Hidetoshi Nishiyama, Hideaki Doi +6 more | 2003-11-18 |
| 6627095 | Magnetic recording disk and method of manufacturing same | Masahiro Hatakeyama, Katsunori Ichiki, Kazuo Yamauchi, Shinta Kunitomo, Yasushi Tohma +1 more | 2003-09-30 |
| 6613593 | Method of fabricating a semiconductor device | Maki Tanaka, Masahiro Watanabe, Mari Nozoe, Hiroshi Miyai | 2003-09-02 |
| 6609833 | Latching system for connector assemblies | Akihiro Miyachi, Masashi Seto | 2003-08-26 |
| 6597448 | Apparatus and method of inspecting foreign particle or defect on a sample | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ohshima, Tetsuya Watanabe, Hisato Nakamura +3 more | 2003-07-22 |
| 6593152 | Electron beam apparatus and method of manufacturing semiconductor device using the apparatus | Mamoru Nakasuji, Tohru Satake, Takeshi Murakami, Nobuharu Noji, Hirosi Sobukawa +9 more | 2003-07-15 |
| 6583414 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Hidetoshi Nishiyama, Shigeaki Hijikata, Koji Abe | 2003-06-24 |
| 6583634 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Keiichi Saiki, Aritoshi Sugimoto, Hiroshi Morioka +2 more | 2003-06-24 |
| 6571766 | Idle speed controller for internal combustion engine | Hiroaki Saeki | 2003-06-03 |
| 6558639 | Apparatus and method for purifying fluids including contaminants | Akira Nagata, Kazushi Nakashima, Takaaki Katagiri | 2003-05-06 |
| 6542830 | Process control system | Fumio Mizuno, Seiji Isogai, Yasuhiro Yoshitake, Terushige Asakawa, Yuichi Ohyama +12 more | 2003-04-01 |