Issued Patents All Time
Showing 226–250 of 468 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062081 | Method and system for analyzing circuit pattern defects | Atsushi Shimoda, Ichirou Ishimaru, Yuji Takagi, Takuo Tamura, Yuichi Hamamura +2 more | 2006-06-13 |
| 7061602 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more | 2006-06-13 |
| 7021056 | Exhaust heat recovery system | Tomonari Ito | 2006-04-04 |
| D517332 | Seat for a motorcycle | Martin Gayle Manchester, Yoshihiro Takanashi | 2006-03-21 |
| 7005641 | Electron beam apparatus and a device manufacturing method by using said electron beam apparatus | Mamoru Nakasuji, Takao Kato, Nobuharu Noji, Tohru Satake, Takeshi Murakami | 2006-02-28 |
| 6998630 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Akira Hamamatsu, Tetsuya Watanabe +1 more | 2006-02-14 |
| 6998611 | Electron beam apparatus and device manufacturing method using same | Mamoru Nakasuji, Takao Kato, Shoji Yoshikawa, Tohru Satake, Nobuharu Noji | 2006-02-14 |
| 6992290 | Electron beam inspection system and inspection method and method of manufacturing devices using the system | Hirosi Sobukawa, Nobuharu Noji, Tohru Satake, Shoji Yoshikawa, Tsutomu Karimata +7 more | 2006-01-31 |
| 6990966 | Heater unit for a combustion-stabilizing device and a combustion stabilizing device including the same | Hiroaki Saeki, Kiyoshi Amou | 2006-01-31 |
| D512669 | Rear fender for a motorcycle | Martin Gayle Manchester, Yoshihiro Takanashi | 2005-12-13 |
| 6971550 | Spouting structure for liquid container and bag-in-box container | Raizo Kuge | 2005-12-06 |
| D511718 | Motorcycle | Martin Gayle Manchester, Yoshihiro Takanashi | 2005-11-22 |
| D511585 | Tail light for a motorcycle | Martin Gayle Manchester, Yoshihiro Takanashi | 2005-11-15 |
| 6952492 | Method and apparatus for inspecting a semiconductor device | Maki Tanaka, Masahiro Watanabe, Mari Nozoe, Hiroshi Miyai | 2005-10-04 |
| 6949735 | Beam source | Masahiro Hatakeyama, Katsunori Ichiki, Tohru Satake | 2005-09-27 |
| 6938417 | Exhaust heat recovery system | Tomonari Ito | 2005-09-06 |
| 6936835 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ohshima, Akira Hamamatsu, Tetsuya Watanabe +1 more | 2005-08-30 |
| 6909092 | Electron beam apparatus and device manufacturing method using same | Ichirota Nagahama, Yuichiro Yamazaki, Masahiro Hatakeyama, Tohru Satake, Nobuharu Noji | 2005-06-21 |
| 6894302 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2005-05-17 |
| 6888959 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more | 2005-05-03 |
| 6876821 | Color image forming apparatus and image quality control system | Hirotaka Ishii | 2005-04-05 |
| 6855929 | Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former | Toshifumi Kimba, Tohru Satake, Tsutomu Karimata, Nobuharu Noji, Takeshi Murakami +6 more | 2005-02-15 |
| 6853143 | Electron beam system and method of manufacturing devices using the system | Mamoru Nakasuji, Takao Kato, Tohru Satake, Takeshi Murakami, Nobuharu Noji | 2005-02-08 |
| 6842540 | Surveillance system | Masataka Okayama, Harumi Morino, Takeo Tomokane, Koichi Inoue, Tomohisa Kohiyama +1 more | 2005-01-11 |
| 6838648 | Temperature detection unit in a high-frequency heating and cooking apparatus | Isao Kasai | 2005-01-04 |