II

Ichiro Ishimaru

NU National University Corporation Kagawa University: 15 patents #2 of 277Top 1%
HI Hitachi: 5 patents #7,555 of 28,497Top 30%
HH Hitachi High-Technologies: 5 patents #533 of 1,917Top 30%
NE Nec: 3 patents #4,195 of 14,502Top 30%
HC Hitachi High-Tech Electronics Engineering Co.: 1 patents #11 of 59Top 20%
TC Techno Network Shikoku Co.: 1 patents #1 of 27Top 4%
Overall (All Time): #177,477 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
12235157 Spectrometry device 2025-02-25
12158417 Spectrometry device 2024-12-03
12102430 Spectral measurement device and spectral measurement method 2024-10-01
11402270 Spectral measurement device and spectral measurement method 2022-08-02
11231272 Optical measuring apparatus and optical measuring method Takeshi Akagawa, Masahiro Kubo, Katsumi Abe, Ersin ALTINTAS, Yuji Ohno +1 more 2022-01-25
11035782 Optical characteristic measuring device and optical characteristic measuring method 2021-06-15
10545016 Light measurement device and optical axis adjustment method Takeshi Akagawa, Masahiro Kubo, Katsumi Abe, Kimiyasu Takoh, Ersin ALTINTAS +2 more 2020-01-28
10503958 Living body determination device, living body determination method, and program Yuji Ohno, Masahiro Kubo, Katsumi Abe, Kimiyasu Takoh, Ersin ALTINTAS +2 more 2019-12-10
10386236 Reflected light detecting device and reflected light detecting method Hiroki Hayashi 2019-08-20
9778166 Microparticle measurement device 2017-10-03
9551670 Surface inspection apparatus and method thereof Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more 2017-01-24
9513165 Spectroscopic measurement device 2016-12-06
9488524 Spectroscopic measurement device having diffraction grating at conjugate plane of relay lens 2016-11-08
9482576 Spectroscopic measurement device having transmissive optical member with a sloped face 2016-11-01
9474476 Spectral characteristics measurement device and spectral characteristics measurement method 2016-10-25
8988689 Spectroscopic measurement device and spectroscopic measurement method 2015-03-24
8830462 Optical characteristic measurement device and optical characteristic measurement method 2014-09-09
8729514 Surface inspection apparatus and method thereof Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more 2014-05-20
7952085 Surface inspection apparatus and method thereof Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more 2011-05-31
7417244 Surface inspection apparatus and method thereof Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more 2008-08-26
7242016 Surface inspection apparatus and method thereof Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more 2007-07-10
7204146 Device and method for measuring thickness Takahiro Okuda 2007-04-17
6894302 Surface inspection apparatus and method thereof Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou +2 more 2005-05-17