Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9551670 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2017-01-24 |
| 8729514 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2014-05-20 |
| 7952085 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2011-05-31 |
| 7417244 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2008-08-26 |
| 7388199 | Probe manufacturing method, probe, and scanning probe microscope | Takafumi Morimoto, Tooru Shinaki, Yoshiyuki Nag'No, Yuuichi Kunitomo, Takenori Hiroki +8 more | 2008-06-17 |
| 7350404 | Scanning type probe microscope and probe moving control method therefor | Tooru Kurenuma, Hiroaki Yanagimoto, Hiroshi Kuroda, Yasushi Minomoto, Shigeru Miwa +5 more | 2008-04-01 |
| 7333191 | Scanning probe microscope and measurement method using the same | Ken Murayama, Yuuichi Kunitomo, Takenori Hiroki, Yoshiyuki Nagano, Takafumi Morimoto +4 more | 2008-02-19 |
| 7242016 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2007-07-10 |
| 6894302 | Surface inspection apparatus and method thereof | Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake +2 more | 2005-05-17 |