TM

Takafumi Morimoto

HC Hitachi Construction Machinery Co.: 6 patents #208 of 1,234Top 20%
HI Hitachi: 5 patents #7,555 of 28,497Top 30%
HC Hitachi Kenki Fine Tech Co.: 4 patents #1 of 29Top 4%
📍 Ibaraki, JP: #610 of 6,779 inventorsTop 9%
Overall (All Time): #314,007 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12181867 Work machine Takashi Saegusa, Yuuki NAGAOKA, Yutaka Watanabe 2024-12-31
8844061 Scanning probe microscope Shuichi Baba, Masahiro Watanabe, Toshihiko Nakata, Yukio Kembo, Toru Kurenuma +2 more 2014-09-23
8342008 Scanning probe microscope Shuichi Baba, Masahiro Watanabe, Toshihiko Nakata, Yukio Kembo, Toru Kurenuma +2 more 2013-01-01
8011230 Scanning probe microscope Masahiro Watanabe, Toru Kurenuma, Hiroshi Kuroda, Shuichi Baba, Toshihiko Nakata +2 more 2011-09-06
7631548 Scanning probe microscope Shuichi Baba, Masahiro Watanabe, Toshihiko Nakata, Toru Kurenuma, Hiroshi Kuroda +2 more 2009-12-15
7388199 Probe manufacturing method, probe, and scanning probe microscope Tooru Shinaki, Yoshiyuki Nag'No, Yukio Kenbou, Yuuichi Kunitomo, Takenori Hiroki +8 more 2008-06-17
7350404 Scanning type probe microscope and probe moving control method therefor Tooru Kurenuma, Hiroaki Yanagimoto, Hiroshi Kuroda, Yasushi Minomoto, Shigeru Miwa +5 more 2008-04-01
7333191 Scanning probe microscope and measurement method using the same Ken Murayama, Yukio Kenbou, Yuuichi Kunitomo, Takenori Hiroki, Yoshiyuki Nagano +4 more 2008-02-19
7243441 Method and apparatus for measuring depth of holes formed on a specimen Masahiro Watanabe, Takenori Hirose, Yukio Kembo, Yoshiyuki Nagano 2007-07-17
6881954 Scanning probe microscope and method of measurement Hiroshi Kuroda 2005-04-19
6278113 Scanning probe microscope Ken Murayama, Takashi Shirai, Hiroshi Kuroda, Harumasa Onozato, Tsuyoshi Nishigaki 2001-08-21
6229607 Fine movement mechanism unit and scanning probe microscope Takashi Shirai, Ken Murayama, Hiroshi Kuroda, Harumasa Onozato 2001-05-08
6184533 Scanning probe microscope with the stage unit Takashi Shirai, Ken Murayama, Hiroshi Kuroda, Harumasa Onozato 2001-02-06
5965881 Scanning probe microscope and processing apparatus Ken Murayama, Sumio Hosaka 1999-10-12
5870716 Home terminal and shopping system Taichi Sugiyama, Yukio Akimoto, Yoshiyuki TSUGE 1999-02-09