Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7388199 | Probe manufacturing method, probe, and scanning probe microscope | Takafumi Morimoto, Tooru Shinaki, Yoshiyuki Nag'No, Yukio Kenbou, Takenori Hiroki +8 more | 2008-06-17 |
| 7350404 | Scanning type probe microscope and probe moving control method therefor | Tooru Kurenuma, Hiroaki Yanagimoto, Hiroshi Kuroda, Yasushi Minomoto, Shigeru Miwa +5 more | 2008-04-01 |
| 7333191 | Scanning probe microscope and measurement method using the same | Ken Murayama, Yukio Kenbou, Takenori Hiroki, Yoshiyuki Nagano, Takafumi Morimoto +4 more | 2008-02-19 |