Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7388199 | Probe manufacturing method, probe, and scanning probe microscope | Takafumi Morimoto, Tooru Shinaki, Yoshiyuki Nag'No, Yukio Kenbou, Yuuichi Kunitomo +8 more | 2008-06-17 |
| 7350404 | Scanning type probe microscope and probe moving control method therefor | Tooru Kurenuma, Hiroshi Kuroda, Yasushi Minomoto, Shigeru Miwa, Ken Murayama +5 more | 2008-04-01 |
| 7333191 | Scanning probe microscope and measurement method using the same | Ken Murayama, Yukio Kenbou, Yuuichi Kunitomo, Takenori Hiroki, Yoshiyuki Nagano +4 more | 2008-02-19 |
| 5293326 | Ultrasonic inspection and imaging instrument | Yukio Arima, Yuichi Kunitomo, Shouya Makihara, Tetsuyoshi Tominaga | 1994-03-08 |
| 5179954 | Ultrasonic inspection and imaging instrument | Yukio Arima, Yuichi Kunitomo, Tetsuyoshi Tominaga | 1993-01-19 |
| D328714 | Ultrasonic flaw detector | Hiroaki Nakajima, Kazuhiko Hiraoka, Yukio Arima, Tetsuyoshi Tominaga | 1992-08-18 |