| 8085238 |
Backlight, display apparatus and light source controlling method |
Takehiro Misonou |
2011-12-27 |
| 6757621 |
Process management system |
Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more |
2004-06-29 |
| 6628817 |
Inspection data analyzing system |
Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more |
2003-09-30 |
| 6542830 |
Process control system |
Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more |
2003-04-01 |
| 6529619 |
Inspection data analyzing system |
Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more |
2003-03-04 |
| 6339653 |
Inspection data analyzing system |
Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more |
2002-01-15 |
| 6330352 |
Inspection data analyzing system |
Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more |
2001-12-11 |
| 6185322 |
Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device |
Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more |
2001-02-06 |
| 5841893 |
Inspection data analyzing system |
Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more |
1998-11-24 |
| 4583223 |
Testing system |
Fumihito Inoue, Kinichi Nakahara, Kazuhiko Kimura |
1986-04-15 |