Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
PP

Paul C. Parries — 57 Patents

IBM: 53 patents #1,572 of 70,183Top 3%
Siemens Aktiengesellschaft: 3 patents #4,667 of 22,248Top 25%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
Infineon Technologies Ag: 2 patents #4,439 of 7,486Top 60%
SCSiemens Components: 1 patents #6 of 30Top 20%
Wappingers Falls, NY: #31 of 884 inventorsTop 4%
New York: #1,513 of 115,490 inventorsTop 2%
Overall (All Time): #43,329 of 4,157,543Top 2%
57 Patents All Time

Issued Patents All Time

Showing 26–50 of 57 patents

Patent #TitleCo-InventorsDate
7888723 Deep trench capacitor in a SOI substrate having a laterally protruding buried strap MaryJane Brodsky, Kangguo Cheng, Herbert L. Ho, Kevin R. Winstel 2011-02-15
7791124 SOI deep trench capacitor employing a non-conformal inner spacer Kangguo Cheng, Herbert L. Ho, Geng Wang 2010-09-07
7705386 Providing isolation for wordline passing over deep trench capacitor Kangguo Cheng, Johnathan E. Faltermeier, Herbert L. Ho 2010-04-27
7564729 Differential and hierarchical sensing for memory circuits John E. Barth, Jr., William Robert Reohr, Matthew R. Wordeman 2009-07-21
7382672 Differential and hierarchical sensing for memory circuits John E. Barth, Jr., William Robert Reohr, Matthew R. Wordeman 2008-06-03
7286385 Differential and hierarchical sensing for memory circuits John E. Barth, Jr., William Robert Reohr, Matthew R. Wordeman 2007-10-23
7193262 Low-cost deep trench decoupling capacitor device and process of manufacture Herbert L. Ho, John E. Barth, Jr., Ramachandra Divakaruni, Wayne F. Ellis, Johnathan E. Faltermeier +4 more 2007-03-20
7194670 Command multiplier for built-in-self-test Jonathan R. Fales, Gregory J. Fredeman, Kevin W. Gorman, Mark D. Jacunski, Toshiaki Kirihata +2 more 2007-03-20
7078247 Early detection of contact liner integrity by chemical reaction Lawrence Bauer, Jr., Kenneth J. Giewont, Subramanian S. Iyer, Bosang Kim, Jeffrey Lloyd +4 more 2006-07-18
7078756 Collarless trench DRAM device Yoichi Otani, Herbert L. Ho, Babar A. Khan 2006-07-18
7057866 System and method for disconnecting a portion of an integrated circuit Louis L. Hsu, Rajiv V. Joshi, Chorng-Lii Hwang, Toshiaki Kirihata 2006-06-06
7046572 Low power manager for standby operation of memory system David R. Hansen, Gregory J. Fredeman, John W. Golz, Hoki Kim 2006-05-16
7023758 Low power manager for standby operation of a memory system David R. Hanson, Gregory J. Fredeman, John W. Golz, Hoki Kim 2006-04-04
6967885 Concurrent refresh mode with distributed row address counters in an embedded DRAM John E. Barth, Jr., Toshiaki Kirihata 2005-11-22
6957372 Repair of address-specific leakage John E. Barth, Jr., Norman W. Robson 2005-10-18
6791348 Digital overcurrent test John E. Barth, Jr. 2004-09-14
6760240 CAM cell with interdigitated search and bit lines Robert E. Busch, Albert M. Chu, Ezra D. B. Hall, Daryl M. Seizter 2004-07-06
6518145 Methods to control the threshold voltage of a deep trench corner device Johann Alsmeier, George R. Goth, Max G. Levy, Victor R. Nastasi, James A. O'Neill 2003-02-11
6429101 Method of forming thermally stable polycrystal to single crystal electrical contact structure Ricky S. Amos, Arne Ballantine, Gregory Bazan, Bomy Chen, Douglas D. Coolbaugh +6 more 2002-08-06
6410399 Process to lower strap, wordline and bitline contact resistance in trench-based DRAMS by silicidization Philip L. Flaitz, Herbert L. Ho, Subramanian S. Iyer, Babar A. Khan 2002-06-25
6399434 Doped structures containing diffusion barriers Susan E. Chaloux, Johnathan E. Faltermeier, Ulrike Gruening, Rajarao Jammy, Christopher C. Parks +2 more 2002-06-04
6294449 Self-aligned contact for closely spaced transistors Teresa J. Wu, Bomy Chen, John W. Golz, Charles W. Koburger, III, Christopher J. Waskiewicz +1 more 2001-09-25
6265278 Deep trench cell capacitor with inverting counter electrode Johann Alsmeier, Jack A. Mandelman, James A. O'Neill, Christopher C. Parks 2001-07-24
6194736 Quantum conductive recrystallization barrier layers Susan E. Chaloux, Tze-Chiang Chen, Johnathan E. Faltermeier, Ulrike Gruening, Rajarao Jammy +4 more 2001-02-27
5976982 Methods for protecting device components from chemical mechanical polish induced defects Max G. Levy, Wolfgang Bergner, Bernhard Fiegl, George R. Goth, Matthew Sendelbach +3 more 1999-11-02