CP

Christopher C. Parks

IBM: 30 patents #3,369 of 70,183Top 5%
Infineon Technologies Ag: 4 patents #3,160 of 7,486Top 45%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
SA Siemens Aktiengesellschaft: 2 patents #6,658 of 22,248Top 30%
SC Siemens Components: 1 patents #6 of 30Top 20%
Overall (All Time): #113,427 of 4,157,543Top 3%
32
Patents All Time

Issued Patents All Time

Showing 25 most recent of 32 patents

Patent #TitleCo-InventorsDate
10483205 Contact using multilayer liner Donghun Kang, Neal A. Makela 2019-11-19
9960118 Contact using multilayer liner Donghun Kang, Neal A. Makela 2018-05-01
9589894 Copper interconnect structure and its formation Daniel C. Edelstein, Takeshi Nogami, Tsong-Lin Tai 2017-03-07
8969197 Copper interconnect structure and its formation Daniel C. Edelstein, Takeshi Nogami, Tsong-Lin Tai 2015-03-03
8901674 Scaling of metal gate with aluminum containing metal layer for threshold voltage shift Keith Kwong Hon Wong, Dechao Guo, Unoh Kwon, Yun-Yu Wang 2014-12-02
8563446 Technique to create a buried plate in embedded dynamic random access memory device Ashima B. Chakravarti, Jacob B. Dadson, Paul Higgins, Babar A. Khan, John J. Moore +1 more 2013-10-22
8431476 Method to prevent surface decomposition of III-V compound semiconductors Joel P. de Souza, Keith E. Fogel, Edward W. Kiewra, Steven J. Koester, Devendra K. Sadana +1 more 2013-04-30
8415772 Method to prevent surface decomposition of III-V compound semiconductors Joel P. de Souza, Keith E. Fogel, Edward W. Kiewra, Steven J. Koester, Devendra K. Sadana +1 more 2013-04-09
8273649 Method to prevent surface decomposition of III-V compound semiconductors Joel P. de Souza, Keith E. Fogel, Edward W. Kiewra, Steven J. Koester, Devendra K. Sadana +1 more 2012-09-25
8236710 Technique to create a buried plate in embedded dynamic random access memory device Ashima B. Chakravarti, Jacob B. Dadson, Paul Higgins, Babar A. Khan, John J. Moore +1 more 2012-08-07
7843067 Method and structure of integrated rhodium contacts with copper interconnects John M. Cotte, Balasubramanian Haran, Xiaoyan Shao, Eva E. Simonyi 2010-11-30
7585765 Formation of oxidation-resistant seed layer for interconnect applications Chih-Chao Yang, Nancy R. Klymko, Keith Kwong Hon Wong 2009-09-08
7276796 Formation of oxidation-resistant seed layer for interconnect applications Chih-Chao Yang, Nancy R. Klymko, Keith Kwong Hon Wong 2007-10-02
7227265 Electroplated copper interconnection structure, process for making and electroplating bath Panayotis Andricacos, Steven H. Boettcher, Dean S. Chung, Hariklia Deligianni, James E. Fluegel +6 more 2007-06-05
6890833 Trench isolation employing a doped oxide trench fill Michael P. Belyansky, Andreas Knorr, Oleg Gluschenkov 2005-05-10
6815343 Gas treatment of thin film structures with catalytic action John David Baniecki, Robert Benjamin Laibowitz, Thomas M. Shaw 2004-11-09
6797582 Vertical thermal nitride mask (anti-collar) and processing thereof Oleg Gluschenkov, Michael P. Chudzik, Rajarao Jammy, Kenneth T. Settlemyer, Jr., Radhika Srinivasan +1 more 2004-09-28
6764551 Process for removing dopant ions from a substrate David Riggs, Rajarao Jammy, John I. Kim, Stephen M. Lucarini, George L. Mack 2004-07-20
6589874 Method for forming electromigration-resistant structures by doping Panayotis Andricacos, Cyril Cabral, Jr., Kenneth P. Rodbell, Roger Y. Tsai 2003-07-08
6572982 Electromigration-resistant copper microstructure Cyprian Emeka Uzoh, Steven H. Boettcher, Patrick W. DeHaven, Andrew H. Simon 2003-06-03
6399434 Doped structures containing diffusion barriers Susan E. Chaloux, Johnathan E. Faltermeier, Ulrike Gruening, Rajarao Jammy, Paul C. Parries +2 more 2002-06-04
6358855 Clean method for recessed conductive barriers Ravikumar Ramachandran, Nicolas Nagel 2002-03-19
6268291 Method for forming electromigration-resistant structures by doping Panayotis Andricacos, Cyril Cabral, Jr., Kenneth P. Rodbell, Roger Y. Tsai 2001-07-31
6265278 Deep trench cell capacitor with inverting counter electrode Johann Alsmeier, Jack A. Mandelman, James A. O'Neill, Paul C. Parries 2001-07-24
6194736 Quantum conductive recrystallization barrier layers Susan E. Chaloux, Tze-Chiang Chen, Johnathan E. Faltermeier, Ulrike Gruening, Rajarao Jammy +4 more 2001-02-27