Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9059315 | Concurrently forming nFET and pFET gate dielectric layers | Takashi Ando, Michael P. Chudzik, Min Dai, Siddarth A. Krishnan, Joseph F. Shepard, Jr. +2 more | 2015-06-16 |
| 9040399 | Threshold voltage adjustment for thin body MOSFETs | Ming Cai, Dechao Guo, William K. Henson, Shreesh Narasimha, Yue Liang +3 more | 2015-05-26 |
| 9029959 | Composite high-k gate dielectric stack for reducing gate leakage | Michael P. Chudzik, Min Dai, Joseph F. Shepard, Jr., Shahab Siddiqui, Yanfeng Wang +1 more | 2015-05-12 |
| 8952460 | Germanium oxide free atomic layer deposition of silicon oxide and high-k gate dielectric on germanium containing channel for CMOS devices | Murshed Chowdhury, Michael P. Chudzik, Min Dai, Siddarth A. Krishnan, Shreesh Narasimha +1 more | 2015-02-10 |
| 8809152 | Germanium oxide free atomic layer deposition of silicon oxide and high-k gate dielectric on germanium containing channel for CMOS devices | Murshed Chowdhury, Michael P. Chudzik, Min Dai, Siddarth A. Krishnan, Shreesh Narasimha +1 more | 2014-08-19 |
| 8198169 | Deep trench capacitor in a SOI substrate having a laterally protruding buried strap | Kangguo Cheng, Herbert L. Ho, Paul C. Parries, Kevin R. Winstel | 2012-06-12 |
| 7888723 | Deep trench capacitor in a SOI substrate having a laterally protruding buried strap | Kangguo Cheng, Herbert L. Ho, Paul C. Parries, Kevin R. Winstel | 2011-02-15 |
| 7875919 | Shallow trench capacitor compatible with high-K / metal gate | Roger A. Booth, Jr., Kangguo Cheng, Chengwen Pei | 2011-01-25 |
| 7759766 | Electrical fuse having a thin fuselink | Roger A. Booth, Jr., Kangguo Cheng, Chengwen Pei | 2010-07-20 |
| 7671394 | Embedded trench capacitor having a high-k node dielectric and a metallic inner electrode | Roger A. Booth, Jr., Kangguo Cheng, Chengwen Pei | 2010-03-02 |
| 7454302 | Method of inspecting integrated circuits during fabrication | Colin J. Brodsky | 2008-11-18 |
| 7397556 | Method, apparatus, and computer program product for optimizing inspection recipes using programmed defects | Oliver D. Patterson, Kourosh Nafisi | 2008-07-08 |
| 7310585 | Method of inspecting integrated circuits during fabrication | Colin J. Brodsky | 2007-12-18 |