| 7203794 |
Destructive-read random access memory system buffered with destructive-read memory cache |
Brian L. Ji, Toshiaki Kirihata, Seiji Munetoh |
2007-04-10 |
| 7057866 |
System and method for disconnecting a portion of an integrated circuit |
Louis L. Hsu, Rajiv V. Joshi, Toshiaki Kirihata, Paul C. Parries |
2006-06-06 |
| 6948028 |
Destructive-read random access memory system buffered with destructive-read memory cache |
Brian L. Ji, Toshiaki Kirihata, Seiji Munetoh |
2005-09-20 |
| 6801980 |
Destructive-read random access memory system buffered with destructive-read memory cache |
Brian L. Ji, Toshiaki Kirihata, Seiji Munetoh |
2004-10-05 |
| 6674673 |
Column redundancy system and method for a micro-cell embedded DRAM (e-DRAM) architecture |
Louis L. Hsu, Gregory J. Fredeman, Toshiaki Kirihata, Dale E. Pontius |
2004-01-06 |
| 6674676 |
Column redundancy system and method for a micro-cell embedded DRAM (e-DRAM) architecture |
Louis L. Hsu, Gregory J. Fredeman, Toshiaki Kirihata, Dale E. Pontius |
2004-01-06 |
| 6621294 |
Pad system for an integrated circuit or device |
Louis L. Hsu, Li-Kong Wang |
2003-09-16 |
| 6445611 |
Method and arrangement for preconditioning in a destructive read memory |
John A. Fifield, Daniel W. Storaska |
2002-09-03 |
| 6440638 |
Method and apparatus for resist planarization |
John W. Golz, John Zhu |
2002-08-27 |
| 6404689 |
Method and structure for hiding a refresh operation in a DRAM having an interlocked pipeline |
Toshiaki Kirihata, Sang Hoo Dhong |
2002-06-11 |
| 6238963 |
Damascene process for forming ferroelectric capacitors |
Bomy Chen |
2001-05-29 |
| 5898706 |
Structure and method for reliability stressing of dielectrics |
Roger A. Dufresne, Charles W. Griffin, William A. Klaasen, Alvin W. Strong |
1999-04-27 |
| 5587614 |
Microplanarization of rough electrodes by thin amorphous layers |
Clarence W. Teng |
1996-12-24 |