Issued Patents All Time
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11922619 | Context-based defect inspection | Bradley Ries, Laurent Karsenti, Kuljit S. Virk, Asaf J. Elron, Ruslan Berdichevsky +7 more | 2024-03-05 |
| 11769242 | Mode selection and defect detection training | Jing Zhang, Yujie Dong, Vishank Bhatia, Patrick McBride, Kris Bhaskar | 2023-09-26 |
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Kris Bhaskar, Laurent Karsenti, Scott A. Young, Mohan Mahadevan, Jing Zhang +4 more | 2023-02-14 |
| 11415526 | Multi-controller inspection system | Mark J. Roulo, Ashok Mathew, Jing Zhang, Kris Bhaskar | 2022-08-16 |
| 10832396 | And noise based care areas | Martin Plihal, Santosh Bhattacharyya, Gordon Rouse, Chris Maher, Erfan Soltanmohammadi | 2020-11-10 |
| 10769761 | Generating high resolution images from low resolution images for semiconductor applications | Saurabh Sharma, Amitoz Singh Dandiana, Mohan Mahadevan, Chao Fang, Amir Azordegan | 2020-09-08 |
| 10713769 | Active learning for defect classifier training | Jing Zhang, Yujie Dong, Richard Wallingford, Michael Daino, Kris Bhaskar | 2020-07-14 |
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Martin Plihal, Mike VonDenHoff, Andrew Cross, Kaushik Sah, Antonio Mani | 2020-06-30 |
| 10670535 | Automated pattern fidelity measurement plan generation | Ajay Gupta, Thanh Huy Ha | 2020-06-02 |
| 10551827 | Hybrid inspection system for efficient process window discovery | — | 2020-02-04 |
| 10539612 | Voltage contrast based fault and defect inference in logic chips | — | 2020-01-21 |
| 10496781 | Metrology recipe generation using predicted metrology images | Chao Fang, Mark D. Smith | 2019-12-03 |
| 10416088 | Virtual inspection systems with multiple modes | Saibal Banerjee | 2019-09-17 |
| 10402461 | Virtual inspection systems for process window characterization | Laurent Karsenti, Kris Bhaskar, Mark Wagner, Vijayakumar Ramachandran | 2019-09-03 |
| 10359371 | Determining one or more characteristics of a pattern of interest on a specimen | Ashok Kulkarni, Michael Lennek, Allen Park | 2019-07-23 |
| 10276346 | Particle beam inspector with independently-controllable beams | Amir Azordegan, Christopher Sears | 2019-04-30 |
| 10267746 | Automated pattern fidelity measurement plan generation | Ajay Gupta, Thanh Huy Ha | 2019-04-23 |
| 10127653 | Determining coordinates for an area of interest on a specimen | Michael Lennek, Changho Lee | 2018-11-13 |
| 9916965 | Hybrid inspectors | Kris Bhaskar, Grace Hsiu-Ling Chen, Keith Wells, Wayne McMillan, Jing Zhang +1 more | 2018-03-13 |
| 9816939 | Virtual inspection systems with multiple modes | Saibal Banerjee | 2017-11-14 |
| 9601393 | Selecting one or more parameters for inspection of a wafer | Chris W. Lee, Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli +1 more | 2017-03-21 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Chetana Bhaskar, Ashok Kulkarni, Chien-Huei Chen, Kris Bhaskar | 2016-02-16 |
| 9222895 | Generalized virtual inspector | Kris Bhaskar | 2015-12-29 |
| 9183624 | Detecting defects on a wafer with run time use of design data | Laurent Karsenti | 2015-11-10 |
| 8537349 | Monitoring of time-varying defect classification performance | Patrick Huet, Martin Plihal, Thomas Trautzsch, Chris Maher | 2013-09-17 |