WM

Walter R. Merry

Applied Materials: 27 patents #426 of 7,310Top 6%
Overall (All Time): #146,102 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
10854425 Feedforward temperature control for plasma processing apparatus Chetan Mahadeswaraswamy, Sergio Fukuda Shoji, Chunlei Zhang, Yashaswini B. Pattar, Duy D. Nguyen +7 more 2020-12-01
9338871 Feedforward temperature control for plasma processing apparatus Chetan Mahadeswaraswamy, Sergio Fukuda Shoji, Chunlei Zhang, Yashaswini B. Pattar, Duy D. Nguyen +7 more 2016-05-10
9214315 Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow Fernando Silveira, Hamid Tavassoli, Xiaoping Zhou, Shane C. Nevil, Douglas A. Buchberger, Jr. +5 more 2015-12-15
8916793 Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow Fernando Silveira, Hamid Tavassoli, Xiaoping Zhou, Shane C. Nevil, Douglas A. Buchberger, Jr. +5 more 2014-12-23
8632689 Temperature control with stacked proportioning valve 2014-01-21
8329593 Method and apparatus for removing polymer from the wafer backside and edge Imad Yousif, Anchel Sheyner, Ajit Balakrishna, Nancy Fung, Ying Rui +2 more 2012-12-11
8313664 Efficient and accurate method for real-time prediction of the self-bias voltage of a wafer and feedback control of ESC voltage in plasma processing chamber Zhigang Chen, Shahid Rauf, Leonid Dorf, Kartik Ramaswamy, Kenneth S. Collins 2012-11-20
8080479 Plasma process uniformity across a wafer by controlling a variable frequency coupled to a harmonic resonator Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf +10 more 2011-12-20
8076247 Plasma process uniformity across a wafer by controlling RF phase between opposing electrodes Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf +10 more 2011-12-13
7967996 Process for wafer backside polymer removal and wafer front side photoresist removal Kenneth S. Collins, Hiroji Hanawa, Andrew Nguyen, Shahid Rauf, Ajit Balakrishna +6 more 2011-06-28
7968469 Method of processing a workpiece in a plasma reactor with variable height ground return path to control plasma ion density uniformity Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf +10 more 2011-06-28
7884025 Plasma process uniformity across a wafer by apportioning ground return path impedances among plural VHF sources Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf +10 more 2011-02-08
7879731 Improving plasma process uniformity across a wafer by apportioning power among plural VHF sources Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf +10 more 2011-02-01
7879183 Apparatus and method for front side protection during backside cleaning Imad Yousif, Ying Rui, Nancy Fung, Martin Jeffrey Salinas, Ajit Balakrishna +2 more 2011-02-01
7554334 Matching network characterization using variable impedance analysis Steven C. Shannon, Daniel J. Hoffman, Steven Lane, Jivko Dinev 2009-06-30
7358192 Method and apparatus for in-situ film stack processing Quanyuan Shang, John M. White 2008-04-15
7056830 Method for plasma etching a dielectric layer Cecilia Y. Mak, Kam S. Law 2006-06-06
6432830 Semiconductor fabrication process 2002-08-13
6355557 Oxide plasma etching process with a controlled wineglass shape James A. Stinnett, Cynthia B. Brooks, Jason Regis 2002-03-12
6248206 Apparatus for sidewall profile control during an etch process Harald Herchen, Michael Welch, William R. Brown 2001-06-19
6062237 Polymer removal from top surfaces and sidewalls of a semiconductor wafer William R. Brown, Harald Herchen, Michael Welch 2000-05-16
6015761 Microwave-activated etching of dielectric layers William R. Brown, Harald Herchen, Michael Welch 2000-01-18
5819434 Etch enhancement using an improved gas distribution plate Harald Herchen, William R. Brown 1998-10-13
5789322 Low volume gas distribution assembly for a chemical downstream etch tool William R. Brown, Harald Herchen, Ihi Nzeadibe 1998-08-04
5786276 Selective plasma etching of silicon nitride in presence of silicon or silicon oxides using mixture of CH3F or CH2F2 and CF4 and O2 Cynthia B. Brooks, Ajey M. Joshi, Gladys D. Quinones, Jitske Trevor 1998-07-28