Issued Patents All Time
Showing 76–100 of 147 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9057873 | Global alignment using multiple alignment pattern candidates | Naoki Hosoya, Toshikazu Kawahara, Akihiro Onizawa | 2015-06-16 |
| 9044856 | Robot apparatus, method of controlling the same, and computer program | Kenichiro Nagasaka, Takashi Kito, Hirokazu Shirado | 2015-06-02 |
| 9043804 | Parallel computer system and program | Masaki Hamamoto, Tetsuya Yamada, Atsushi TOMODA | 2015-05-26 |
| 9019362 | Charged particle beam device and a method of improving image quality of the same | Jie Bai, Kenji Nakahira, Chie Shishido, Hideyuki Kazumi | 2015-04-28 |
| 8996176 | Robot apparatus, method for controlling the same, and computer program | Genta Kondo, Satoru Shimizu | 2015-03-31 |
| 8953868 | Defect inspection method and defect inspection apparatus | Shinya Murakami, Chie Shishido, Takashi Hiroi, Taku Ninomiya, Tsuyoshi Minakawa | 2015-02-10 |
| 8881067 | Method and apparatus for monitoring cross-sectional shape of a pattern formed on a semiconductor device | Wataru Nagatomo, Hidetoshi Morokuma | 2014-11-04 |
| RE45224 | Method and apparatus for creating imaging recipe | Wataru Nagatomo, Ryoichi Matsuoka, Hidetoshi Morokuma, Takumichi Sutani | 2014-10-28 |
| RE45204 | Method and apparatus for creating imaging recipe | Wataru Nagatomo, Ryoichi Matsuoka, Hidetoshi Morokuma, Takumichi Sutani | 2014-10-21 |
| 8853630 | Scanning electron microscope and a method for imaging a specimen using the same | Wataru Nagatomo, Ryoichi Matsuoka, Hidetoshi Morokuma | 2014-10-07 |
| 8797385 | Robot device and method of controlling robot device | Toshimitsu Tsuboi, Kenta Kawamoto, Yasunori Kawanami | 2014-08-05 |
| 8767038 | Method and device for synthesizing panorama image using scanning charged-particle microscope | Go Kotaki, Ryoichi Matsuoka | 2014-07-01 |
| 8730318 | Inspection apparatus and method for producing image for inspection | Kenji Nakahira, Naoki Hosoya, Minoru Yoshida | 2014-05-20 |
| 8731275 | Method and apparatus for reviewing defects | Minoru Harada, Ryo Nakagaki, Kenji Obara | 2014-05-20 |
| 8725296 | Gripping judgment apparatus and gripping judgment method | Kenichiro Nagasaka, Toshimitsu Tsuboi, Yasunori Kawanami, Tetsuharu Fukushima, Kenta Kawamoto | 2014-05-13 |
| 8704464 | Charged particle trajectory control apparatus, charged particle accelerator, charged particle storage ring, and deflection electromagnet | Shigemi Sasaki | 2014-04-22 |
| 8699906 | Printing system provided with preheaters | Soushi Kikuchi | 2014-04-15 |
| 8642957 | Scanning electron microscope and a method for imaging a specimen using the same | Wataru Nagatomo, Ryoichi Matsuoka, Hidetoshi Morokuma | 2014-02-04 |
| 8585599 | Ultrasonographic device and method for improving ultrasonographic device image quality | Kenji Nakahira | 2013-11-19 |
| 8508620 | Portable terminal capable of presenting images based on time | — | 2013-08-13 |
| 8481936 | Scanning electron microscope system and method for measuring dimensions of patterns formed on semiconductor device by using the system | Chie Shishido, Maki Tanaka | 2013-07-09 |
| 8461527 | Scanning electron microscope and method for processing an image obtained by the scanning electron microscope | Kenji Nakahira, Toshifumi Honda | 2013-06-11 |
| 8385799 | Lubricating device, fixing device, and image forming apparatus | — | 2013-02-26 |
| 8367312 | Detergent for lithography and method of forming resist pattern with the same | Yoshihiro Sawada, Kazumasa Wakiya, Jun Koshiyama, Hidekazu Tajima, Tomoya Kumagai +1 more | 2013-02-05 |
| 8357897 | Charged particle beam device | Chie Shishido, Mayuka Iwasaki, Tomofumi Nishiura, Go Kotaki | 2013-01-22 |