Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387334 | Ultrasound diagnostic apparatus and ultrasound image processing method | Kenta Inoue, Takehiro Tsujita, Yoko Horie, Maki Kuwayama | 2025-08-12 |
| 12249417 | Ultrasonic diagnostic device and diagnostic assisting method | — | 2025-03-11 |
| 11657909 | Medical image processing apparatus and medical image processing method | Yoshimi NOGUCHI | 2023-05-23 |
| 11526991 | Medical image processing apparatus, and medical imaging apparatus | Nao ITO, Yoshimi NOGUCHI, Maki Kuwayama | 2022-12-13 |
| 11461938 | Ultrasonic imaging device and image processing device | Kazuhiro Yamanaka, Hiroki Tanaka, Junichi Shiokawa | 2022-10-04 |
| 9913625 | Medical diagnosis device and measurement method thereof | Tomoaki Chono, Takahiro Kashiyama | 2018-03-13 |
| 9342922 | Medical imaging apparatus and method of constructing medical images | — | 2016-05-17 |
| 8357897 | Charged particle beam device | Chie Shishido, Atsushi Miyamoto, Mayuka Iwasaki, Go Kotaki | 2013-01-22 |
| 8331651 | Method and apparatus for inspecting defect of pattern formed on semiconductor device | Atsushi Miyamoto, Chie Shishido, Takumichi Sutani | 2012-12-11 |
| 8283630 | Method and apparatus for measuring dimension of circuit pattern formed on substrate by using scanning electron microscope | Atsushi Miyamoto | 2012-10-09 |
| 8073242 | SEM system and a method for producing a recipe | Atsushi Miyamoto, Ryoichi Matsuoka, Hidetoshi Morokuma | 2011-12-06 |
| 8045789 | Method and apparatus for inspecting defect of pattern formed on semiconductor device | Atsushi Miyamoto, Chie Shishido, Takumichi Sutani | 2011-10-25 |
| 7888638 | Method and apparatus for measuring dimension of circuit pattern formed on substrate by using scanning electron microscope | Atsushi Miyamoto | 2011-02-15 |
| 7545279 | Condition-analyzing device | Isao Sato, Masato Nakajima, Kazuhiro Mimura, Yasuhiro Takemura, Kei Katou +1 more | 2009-06-09 |