Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12329044 | Applying inert ion beam etching for improving a profile and repairing sidewall damage for phase change memory devices | Luxherta Buzi, Thitima Suwannasiri, Robert L. Bruce, Sebastian U. Engelmann | 2025-06-10 |
| 11820663 | Crystalline film of carbon nanotubes | Abram L. Falk, Damon B. Farmer | 2023-11-21 |
| 10386409 | Non-destructive determination of components of integrated circuits | Chung-Ching Lin, Franco Stellari | 2019-08-20 |
| 8889546 | Discontinuous/non-uniform metal cap structure and process for interconnect integration | Chih-Chao Yang, Chao-Kun Hu, Surbhi Mittal | 2014-11-18 |
| 8866257 | System involving electrically reprogrammable fuses | Kaushik Chanda, Wai-Kin Ll, Ping-Chaun Wang | 2014-10-21 |
| 8823176 | Discontinuous/non-uniform metal cap structure and process for interconnect integration | Chih-Chao Yang, Chao-Kun Hu, Surbhi Mittal | 2014-09-02 |
| 8716071 | Methods and systems involving electrically reprogrammable fuses | Kaushik Chanda, Wai-Kin Li, Ping-Chuan Wang | 2014-05-06 |
| 8679970 | Structure and process for conductive contact integration | Chih-Chao Yang | 2014-03-25 |
| 8535991 | Methods and systems involving electrically reprogrammable fuses | Kaushik Chanda, Wai-Kin Li, Ping-Chuan Wang | 2013-09-17 |
| 8133767 | Efficient interconnect structure for electrical fuse applications | Chih-Chao Yang, Chao-Kun Hu | 2012-03-13 |
| 7893520 | Efficient interconnect structure for electrical fuse applications | Chih-Chao Yang, Chao-Kun Hu | 2011-02-22 |
| 7767962 | Method for SEM measurement of features using magnetically filtered low loss electron microscopy | Oliver C. Wells | 2010-08-03 |
| 7345305 | Control of liner thickness for improving thermal cycle reliability | Ronald G. Filippi, Vincent J. McGahay, Conal E. Murray, Hazara S. Rathore, Thomas M. Shaw +1 more | 2008-03-18 |
| 7247946 | On-chip Cu interconnection using 1 to 5 nm thick metal cap | John Bruley, Roy A. Carruthers, Chao-Kun Hu, Eric G. Liniger, Sandra G. Malhotra +1 more | 2007-07-24 |
| 7105817 | Method of forming images in a scanning electron microscope | Conal E. Murray, Oliver C. Wells | 2006-09-12 |
| 6989282 | Control of liner thickness for improving thermal cycle reliability | Ronald G. Filippi, Vincent J. McGahay, Conal E. Murray, Hazara S. Rathore, Thomas M. Shaw +1 more | 2006-01-24 |
| 6979393 | Method for plating copper conductors and devices formed | Kenneth P. Rodbell, Panayotis Andricacos, Cyril Cabral, Jr., Cyprian Emeka Uzoh, Peter S. Locke | 2005-12-27 |
| 6784485 | Diffusion barrier layer and semiconductor device containing same | Stephan A. Cohen, Timothy J. Dalton, John A. Fitzsimmons, Stephen M. Gates, Paul C. Jamison +5 more | 2004-08-31 |
| 6768111 | Method for SEM measurement of topological features | Oliver C. Wells, Jonathan Rullan, Conal E. Murray | 2004-07-27 |
| 6570255 | Method for forming interconnects on semiconductor substrates and structures formed | Panayotis Andricacos, Cyril Cabral, Jr., John M. Cotte, Wilma Jean Horkans, Kenneth P. Rodbell | 2003-05-27 |
| 6509265 | Process for manufacturing a contact barrier | Patrick W. DeHaven, Anthony G. Domenicucci, Glen L. Miles, Prabhat Tiwari, Yun-Yu Wang +2 more | 2003-01-21 |
| 6448173 | Aluminum-based metallization exhibiting reduced electromigration and method therefor | Lawrence A. Clevenger, Ronald G. Filippi, Kenneth P. Rodbell, Roy Iggulden, Chao-Kun Hu +3 more | 2002-09-10 |
| 6436823 | Method for forming a TiN layer on top of a metal silicide layer in a semiconductor structure and structure formed | Cyril Cabral, Jr., Chung-Ping Eng, Christian Lavoie, Patricia A. O'Neil, Kirk D. Peterson +3 more | 2002-08-20 |
| 6429523 | Method for forming interconnects on semiconductor substrates and structures formed | Panayotis Andricacos, Cyril Cabral, Jr., John M. Cotte, Wilma Jean Horkans, Kenneth P. Rodbell | 2002-08-06 |
| 6417567 | Flat interface for a metal-silicon contract barrier film | Anthony G. Domenicucci, Yun-Yu Wang, Horatio S. Wildman, Kwong Hon Wong, Roy A. Carruthers +2 more | 2002-07-09 |