OW

Oliver C. Wells

IBM: 9 patents #11,918 of 70,183Top 20%
Overall (All Time): #582,177 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDate
7767962 Method for SEM measurement of features using magnetically filtered low loss electron microscopy Lynne M. Gignac 2010-08-03
7105817 Method of forming images in a scanning electron microscope Lynne M. Gignac, Conal E. Murray 2006-09-12
6768111 Method for SEM measurement of topological features Lynne M. Gignac, Jonathan Rullan, Conal E. Murray 2004-07-27
5408098 Method and apparatus for detecting low loss electrons in a scanning electron microscope 1995-04-18
5047649 Method and apparatus for writing or etching narrow linewidth patterns on insulating materials Rodney T. Hodgson, Jackson E. Stanland 1991-09-10
4962306 Magnetically filtered low loss scanning electron microscopy Rodney T. Hodgson, Francoise Kolmer Legoues 1990-10-09
4785189 Method and apparatus for low-energy scanning electron beam lithography 1988-11-15
4665313 Apparatus and method for displaying hole-electron pair distributions induced by electron bombardment 1987-05-12
4618767 Low-energy scanning transmission electron microscope David A. Smith 1986-10-21