Issued Patents All Time
Showing 25 most recent of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410291 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Rajesh Manepalli, Saibal Banerjee, John Kirkland | 2022-08-09 |
| 10706522 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Rajesh Manepalli, Saibal Banerjee, John Kirkland | 2020-07-07 |
| 10503078 | Criticality analysis augmented process window qualification sampling | Jagdish Chandra Saraswatula, Saibal Banerjee | 2019-12-10 |
| 10359371 | Determining one or more characteristics of a pattern of interest on a specimen | Brian Duffy, Michael Lennek, Allen Park | 2019-07-23 |
| 10181185 | Image based specimen process control | Allen Park, Lisheng Gao, Saibal Banerjee, Ping Gu, Songnian Rong +1 more | 2019-01-15 |
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Saibal Banerjee, Santosh Bhattacharyya, Bjorn Brauer | 2018-11-13 |
| 10074167 | Reducing registration and design vicinity induced noise for intra-die inspection | Saibal Banerjee, Shaoyu Lu | 2018-09-11 |
| 10043261 | Generating simulated output for a specimen | Kris Bhaskar, Jing Zhang, Grace Hsiu-Ling Chen, Laurent Karsenti | 2018-08-07 |
| 9965848 | Shape based grouping | Saibal Banerjee, Jagdish Chandra Saraswatula, Santosh Bhattacharyya | 2018-05-08 |
| 9767548 | Outlier detection on pattern of interest image populations | Saibal Banerjee | 2017-09-19 |
| 9401016 | Using high resolution full die image data for inspection | — | 2016-07-26 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Mohan Mahadevan, Ajay Gupta, Chien-Huei Chen, Jason Kirkwood +2 more | 2016-06-07 |
| 9355208 | Detecting defects on a wafer | Eugene Shifrin, Kris Bhaskar, Graham Michael Lynch, John R. Jordan, Chwen-Jiann Fang | 2016-05-31 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Chetana Bhaskar, Chien-Huei Chen, Kris Bhaskar, Brian Duffy | 2016-02-16 |
| 9224660 | Tuning wafer inspection recipes using precise defect locations | Lisheng Gao, Junqing Huang | 2015-12-29 |
| 9170211 | Design-based inspection using repeating structures | Chien-Huei Chen | 2015-10-27 |
| 9098891 | Adaptive sampling for semiconductor inspection recipe creation, defect review, and metrology | Saibal Banerjee | 2015-08-04 |
| 9053390 | Automated inspection scenario generation | Mohan Mahadevan, Govind Thattaisundaram, Ajay Gupta, Chien-Huei Chen, Jason Kirkwood +3 more | 2015-06-09 |
| 9041930 | Digital pathology system | Scott A. Young, Eliezer Rosengaus | 2015-05-26 |
| 8781781 | Dynamic care areas | Chien-Huei Chen | 2014-07-15 |
| 8611639 | Semiconductor device property extraction, generation, visualization, and monitoring methods | Chien-Huei Chen, Cecelia Campochiaro, Richard Wallingford, Yong Zhang, Brian Duffy | 2013-12-17 |
| 8600143 | Method and system for hierarchical tissue analysis and classification | Scott A. Young, Eliezer Rosengaus | 2013-12-03 |
| 8139843 | Methods and systems for utilizing design data in combination with inspection data | Brian Duffy, Kais Maayah, Gordon Rouse | 2012-03-20 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Kris Bhaskar, Chetana Bhaskar, Eliezer Rosengaus, Cecelia Campochiaro, Chris Maher +6 more | 2012-02-28 |
| 8111900 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson +3 more | 2012-02-07 |