Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10789703 | Semi-supervised anomaly detection in scanning electron microscope images | Li He, Sankar Venkataraman | 2020-09-29 |
| 10074167 | Reducing registration and design vicinity induced noise for intra-die inspection | Saibal Banerjee, Ashok Kulkarni | 2018-09-11 |