VN

Vijay Narayanan

IBM: 233 patents #125 of 70,183Top 1%
Globalfoundries: 29 patents #87 of 4,424Top 2%
UL Ulvac: 7 patents #38 of 680Top 6%
TL Tokyo Electron Limited: 4 patents #1,723 of 5,567Top 35%
UA U.S. Bank National Association: 4 patents #5 of 53Top 10%
YH Yahoo Holdings: 3 patents #543 of 2,500Top 25%
Microsoft: 2 patents #17,506 of 40,388Top 45%
SF SUNY Research Foundation: 1 patents #469 of 1,165Top 45%
FI Fair Issac: 1 patents #1 of 12Top 9%
CN CNRS: 1 patents #3,857 of 11,908Top 35%
📍 San Jose, CA: #34 of 32,062 inventorsTop 1%
🗺 California: #331 of 386,348 inventorsTop 1%
Overall (All Time): #1,875 of 4,157,543Top 1%
256
Patents All Time

Issued Patents All Time

Showing 151–175 of 256 patents

Patent #TitleCo-InventorsDate
8835260 Control of threshold voltages in high-k metal gate stack and structures for CMOS devices Hemanth Jagannathan, Takashi Ando 2014-09-16
8796784 Devices and methods to optimize materials and properties for replacement metal gate structures Takashi Ando, Christian Lavoie 2014-08-05
8785322 Devices and methods to optimize materials and properties for replacement metal gate structures Takashi Ando, Christian Lavoie 2014-07-22
8785995 Ferroelectric semiconductor transistor devices having gate modulated conductive layer Catherine A. Dubourdieu, David J. Frank, Martin M. Frank, Paul M. Solomon, Thomas Theis 2014-07-22
8786030 Gate-last fabrication of quarter-gap MGHK FET Takashi Ando, Kisik Choi, Tenko Yamashita, Junli Wang 2014-07-22
8753936 Changing effective work function using ion implantation during dual work function metal gate integration Michael P. Chudzik, Martin M. Frank, Herbert L. Ho, Mark J. Hurley, Rashmi Jha +3 more 2014-06-17
8754403 Epitaxial source/drain contacts self-aligned to gates for deposited FET channels Josephine B. Chang, Paul Chang, Jeffrey W. Sleight 2014-06-17
8748991 Control of flatband voltages and threshold voltages in high-k metal gate stacks and structures for CMOS devices Hemanth Jagannathan, Takashi Ando 2014-06-10
8741713 Reliable physical unclonable function for device authentication John Bruley, Dirk Pfeiffer, Jean-Oliver Plouchart, Peilin Song 2014-06-03
8735243 FET device with stabilized threshold modifying material Matthew W. Copel, Bruce B. Doris, Yun-Yu Wang 2014-05-27
8735996 Scavenging metal stack for a high-K gate dielectric Takashi Ando, Unoh Kwon, James K. Schaeffer 2014-05-27
8732014 Automatic classification of display ads using ad images and landing pages Andrew Edward Kae, Kin Fai Kan 2014-05-20
8722548 Structures and techniques for atomic layer deposition Shintaro Aoyama, Robert D. Clark, Steven P. Consiglio, Marinus Hopstaken, Hemanth Jagannathan +4 more 2014-05-13
8716088 Scavenging metal stack for a high-K gate dielectric Takashi Ando, Unoh Kwon, James K. Schaeffer 2014-05-06
8716118 Replacement gate structure for transistor with a high-K gate stack Takashi Ando, Eduard A. Cartier, Unoh Kwon 2014-05-06
8716813 Scaled equivalent oxide thickness for field effect transistor devices Takashi Ando, Changhwan Choi, Unoh Kwon 2014-05-06
8680629 Control of flatband voltages and threshold voltages in high-k metal gate stacks and structures for CMOS devices Hemanth Jagannathan, Takashi Ando 2014-03-25
8680623 Techniques for enabling multiple Vt devices using high-K metal gate stacks Martin M. Frank, Arvind Kumar, Vamsi K. Paruchuri, Jeffrey W. Sleight 2014-03-25
8658501 Method and apparatus for flatband voltage tuning of high-k field effect transistors Supratik Guha, Vamsi K. Paruchuri 2014-02-25
8592296 Gate-last fabrication of quarter-gap MGHK FET Takashi Ando, Kisik Choi, Tenko Yamashita, Junli Wang 2013-11-26
8569844 Metal gate CMOS with at least a single gate metal and dual gate dielectrics Bruce B. Doris, Young-Hee Kim, Barry P. Linder, Vamsi K. Paruchuri 2013-10-29
8564074 Self-limiting oxygen seal for high-K dielectric and design structure Terence B. Hook, Jay M. Shah, Melanie J. Sherony, Kenneth J. Stein, Helen Wang +1 more 2013-10-22
8518766 Method of forming switching device having a molybdenum oxynitride metal gate Nestor A. Bojarczuk, Michael P. Chudzik, Matthew W. Copel, Supratik Guha, Richard A. Haight +2 more 2013-08-27
8513099 Epitaxial source/drain contacts self-aligned to gates for deposited FET channels Josephine B. Chang, Paul Chang, Jeffrey W. Sleight 2013-08-20
8507992 High-K metal gate CMOS Renee T. Mo, Huiming Bu, Michael P. Chudzik, William K. Henson, Mukesh V. Khare 2013-08-13