MS

Melanie J. Sherony

IBM: 9 patents #11,918 of 70,183Top 20%
FS Freeescale Semiconductor: 3 patents #982 of 3,767Top 30%
CM Chartered Semiconductor Manufacturing: 2 patents #256 of 840Top 35%
Infineon Technologies Ag: 2 patents #4,439 of 7,486Top 60%
Samsung: 1 patents #49,284 of 75,807Top 70%
GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%
📍 Wappingers Falls, NY: #169 of 884 inventorsTop 20%
🗺 New York: #12,360 of 115,490 inventorsTop 15%
Overall (All Time): #420,594 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
9178495 Establishing a thermal profile across a semiconductor chip Terence B. Hook, Christopher M. Schnabel 2015-11-03
9064824 In-situ annealing for extending the lifetime of CMOS products Terence B. Hook, Christopher M. Schnabel 2015-06-23
9059120 In-situ relaxation for improved CMOS product lifetime Terence B. Hook, Christopher M. Schnabel 2015-06-16
8564074 Self-limiting oxygen seal for high-K dielectric and design structure Terence B. Hook, Vijay Narayanan, Jay M. Shah, Kenneth J. Stein, Helen Wang +1 more 2013-10-22
8445969 High pressure deuterium treatment for semiconductor/high-K insulator interface Xiangdong Chen, Laegu Kang, Weipeng Li, Dae-Gyu Park 2013-05-21
8106462 Balancing NFET and PFET performance using straining layers Xiangdong Chen, Weipeng Li, Anda C. Mocuta, Dae-Gyu Park, Kenneth J. Stein +8 more 2012-01-31
7893502 Threshold voltage improvement employing fluorine implantation and adjustment oxide layer Weipeng Li, Dae-Gyu Park, Jin-Ping Han, Yong Meng Lee 2011-02-22
7879666 Semiconductor resistor formed in metal gate stack Da Zhang, Chendong Zhu, Xiangdong Chen 2011-02-01
7471548 Structure of static random access memory with stress engineering for stability Christopher V. Baiocco, Xiangdong Chen, Young-Gun Ko 2008-12-30
6750109 Halo-free non-rectifying contact on chip with halo source/drain diffusion James A. Culp, Jawahar P. Nayak, Werner Rausch, Steven H. Voldman, Noah Zamdmer 2004-06-15
6429482 Halo-free non-rectifying contact on chip with halo source/drain diffusion James A. Culp, Jawahar P. Nayak, Werner Rausch, Steven H. Voldman, Noah Zamdmer 2002-08-06
6395587 Fully amorphized source/drain for leaky junctions Scott W. Crowder, Dominic J. Schepis 2002-05-28