DE

Dirk Heinrich Ehm

CG Carl Zeiss Smt Gmbh: 40 patents #23 of 1,189Top 2%
AB Asml Netherlands B.V.: 13 patents #348 of 3,192Top 15%
📍 Beckingen, DE: #1 of 17 inventorsTop 6%
Overall (All Time): #78,010 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 26–40 of 40 patents

Patent #TitleCo-InventorsDate
8717531 Mirror for guiding a radiation bundle Severin Waldis, Florian Bach, Daniel Benz, Armin Werber, Wilfried Noell +2 more 2014-05-06
8698999 Protection module for EUV lithography apparatus, and EUV lithography apparatus Timo Laufer, Ben Banney, Jens Kugler, Ulrich Nieken, Franz Keller 2014-04-15
8585224 Optical arrangement, in particular projection exposure apparatus for EUV lithography, as well as reflective optical element with reduced contamination Stephan Muellender, Thomas Stein, Johannes Hubertus Josephina Moors, Bastiaan Theodoor Wolschrijn, Dieter Kraus +2 more 2013-11-19
8553200 Optical element with at least one electrically conductive region, and illumination system with the optical element Bastiaan Theodoor Wolschrijn, Berndt Warm 2013-10-08
8546776 Optical system for EUV lithography with a charged-particle source Markus Weiss, Christoph Zaczek, Tobias Hackl, Wolfgang Seitz 2013-10-01
8477285 Particle cleaning of optical elements for microlithography Arnoldus Jan Storm, Johannes Hubertus Josephina Moors, Almut Czap, Mona Nagel, Jacques Cor Johan Van Der Donck +4 more 2013-07-02
8419862 Method for removing a contamination layer from an optical surface and arrangement therefor as well as a method for generating a cleaning gas and arrangement therefor Arnold Storm, Johannes Josephina Moors, Bastiaan Theodoor Wolschrijn, Thomas Stein, Edwin te Sligte 2013-04-16
8382301 Optical arrangement, in particular projection exposure apparatus for EUV lithography, as well as reflective optical element with reduced contamination Stephan Muellender, Thomas Stein, Johannes Hubertus Josephina Moors, Bastiaan Theodoor Wolschrijn, Dieter Kraus +2 more 2013-02-26
8339576 Projection objective of a microlithographic projection exposure apparatus Ulrich Loering, Vladimir Kamenov, Stefan Schmidt, Moritz Becker, Andreas Wurmbrand 2012-12-25
8279397 Method for removing contamination on optical surfaces and optical arrangement Johannes Hubertus Josephina Moors, Bastiaan Theodoor Wolschrijn, Vadim Yevgenyevich Banine, Vladimir Vitalevitsch Ivanov 2012-10-02
8054446 EUV lithography apparatus and method for determining the contamination status of an EUV-reflective optical surface Dieter Kraus, Stefan Schmidt 2011-11-08
7959310 Optical arrangement and EUV lithography device with at least one heated optical element, operating methods, and methods for cleaning as well as for providing an optical element Annemieke Van De Runstraat, Bastiaan Theodoor Wolschrijn, Arnoldus Jan Storm, Thomas Stein, Marco G. H. Meijerink +8 more 2011-06-14
7911598 Method for cleaning an EUV lithography device, method for measuring the residual gas atmosphere and the contamination and EUV lithography device Dieter Kraus, Thomas Stein, Harald Woelfle, Stefan Schmidt 2011-03-22
7763870 Optical system for radiation in the EUV-wavelength range and method for measuring a contamination status of EUV-reflective elements Hermann Bieg, Hans-Juergen Mann, Stephan Muellender, Johannes Hubertus Josephina Moors, Bastiaan Theodoor Wolschrijn 2010-07-27
7671347 Cleaning method, apparatus and cleaning system Johannes Hubertus Josephina Moors, Bastiaan Theodoor Wolschrijn, Marcus Gerhardus Hendrikus Meijerink, Thomas Stein 2010-03-02