Home › Companies › Hitachi High-Technologies

HH

Hitachi High-Technologies — 2,891 Patents

Rank (All Time): #269 of 105,732Top 1%

2,457 inventors

2,891 Patents All Time

Patents per Year

Top Inventors at Hitachi High-Technologies All Time

Showing 51–100 of 2,457 inventors

Rank	Name	Patents
#49	Kenetsu Yokogawa	43
#49	Isao Yamazaki	42
#49	Yoshinori Nakayama	29
#54	Izumi Waki	27
#54	Ryoji Nishio	28
#56	Hiroshi Makino	26
#56	Satoshi Tomimatsu	26
#56	Takumichi Sutani	27
#56	Motohiro Yamazaki	48
#56	Kei Shimura	32
#61	Hideo Todokoro	26
#61	Yoshimasa Oshima	25
#61	Daisuke Shiraishi	33
#61	Hitoshi Tokieda	31
#61	Akitaka Makino	26
#66	Atsushi Takane	24
#66	Mitsuji Ikeda	26
#66	Tetsuya Watanabe	24
#66	Seiichiro Kanno	32
#66	Tetsuo Ono	29
#66	Yasushi Terui	25
#72	Hiroyuki Nakano	23
#72	Hiroya Ohta	28
#72	Hideyuki Yamamoto	23
#72	Tomohiro Shoji	27
#72	Akihisa Makino	46
#72	Sakuichiro Adachi	37
#72	Satomi Inoue	35
#72	Tatehito Usui	35
#72	Satoru Yamaguchi	32
#72	Akira Ikegami	30
#72	Satoshi Takahashi	29
#72	Hideki Kihara	24
#72	Hiroyuki Satake	24
#85	Hiroyuki Suzuki	22
#85	Ken Yoshioka	22
#85	Noritsugu Takahashi	25
#85	Takeshi Kawasaki	22
#85	Toshihide Agemura	36
#85	Masuyuki Sugiyama	33
#91	Katsuhiro Sasada	21
#91	Shinsuke Kawanishi	22
#91	Shuichi Nakagawa	31
#91	Yuko Sasaki	28
#91	Tomonori Nakano	24
#91	Junichi Tanaka	22
#91	Masahiro Watanabe	22
#98	Katsuaki Takahashi	21
#98	Makoto Ezumi	20
#98	Motohiko Yoshigai	20

« Prev 123 4 Next »

Most Valuable Patents

Patent	Est. Value	Year
Method and apparatus for inspecting pattern defects	$482K	2008
Mass spectrometer and mass analysis method	$400K	2008
Electron microscope, measuring method using the same, electron microscope system, and method for controlling the system	$328K	2008
Biomagnetic measurement apparatus	$328K	2008
Method and apparatus for detecting defects in a specimen utilizing information concerning the specimen	$328K	2008

All 100 most valuable US patents →